Dielectric constant and loss tangent measurement using a stripline fixture

Heping Yue, K. L. Virga, J. L. Prince

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An approach to dielectric material characterization with a vector network analyzer is presented. As the characteristic impedance (Z0) of a stripline transmission line can be accurately determined by measuring the two-port scattering parameters in the frequency range of interest, the dielectric constant of the insulation material that consists of part of the stripline configuration is then obtained by relationship to the characteristic impedance. The dielectric loss (or loss tangent) can be determined by measuring the return loss and the insertion loss of the stripline. The validity of the technique is demonstrated for well-characterized dielectric materials such as Teflon-based and other composite laminates. The technique is then applied to IC molding compounds as processed.

Original languageEnglish (US)
Title of host publication1998 Proceedings - 48th Electronic Components and Technology Conference, ECTC 1998
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1077-1082
Number of pages6
ISBN (Print)0780345266
DOIs
StatePublished - Jan 1 1998
Event48th Electronic Components and Technology Conference, ECTC 1998 - Seattle, United States
Duration: May 25 1998May 28 1998

Publication series

NameProceedings - Electronic Components and Technology Conference
VolumePart F133492
ISSN (Print)0569-5503

Conference

Conference48th Electronic Components and Technology Conference, ECTC 1998
CountryUnited States
CitySeattle
Period5/25/985/28/98

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Yue, H., Virga, K. L., & Prince, J. L. (1998). Dielectric constant and loss tangent measurement using a stripline fixture. In 1998 Proceedings - 48th Electronic Components and Technology Conference, ECTC 1998 (pp. 1077-1082). [678848] (Proceedings - Electronic Components and Technology Conference; Vol. Part F133492). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ECTC.1998.678848