Dielectric tensor characterization and evaluation of several magneto-optical recording media

Hong Fu, Zheng Yan, Seh Kwang Lee, Masud Mansuripur

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

A dielectric tensor database for magneto-optical (MO) thin film media in high density MO recording has been established. The measurement method used involves a combination of variable angle ellipsometry, reflection-transmission measurements, and polar Kerr effect measurements. The MULTILAYER program is used to analyze the measurements data and search for the best-estimate values of the unknown parameters. This method, which comprises measurements at a wide range of incident angles and at different wavelengths, provides a high degree of accuracy for characterizing the thickness and the dielectric tensor elements of thin film samples. The wavelength dependence of the dielectric tensor is obtained for the following MO materials: (BiDy)3(FeGa)5O12, MnBi, multilayered Co/Pt, TbFeCoTa, and fcc cobalt. The measurement results for the Heusler alloy PtMnSb, which has been available from the literature, is summarized. In the blue-green regime, the relationship among the derived values of figure of merit for these materials is given.

Original languageEnglish (US)
Pages (from-to)4076-4090
Number of pages15
JournalJournal of Applied Physics
Volume78
Issue number6
DOIs
StatePublished - Jan 1 1995

Fingerprint

recording
tensors
evaluation
optical materials
thin films
Kerr effects
figure of merit
wavelengths
ellipsometry
cobalt
estimates

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physics and Astronomy (miscellaneous)

Cite this

Dielectric tensor characterization and evaluation of several magneto-optical recording media. / Fu, Hong; Yan, Zheng; Lee, Seh Kwang; Mansuripur, Masud.

In: Journal of Applied Physics, Vol. 78, No. 6, 01.01.1995, p. 4076-4090.

Research output: Contribution to journalArticle

@article{7d1ade29bd6f43678b29837e4154dfb4,
title = "Dielectric tensor characterization and evaluation of several magneto-optical recording media",
abstract = "A dielectric tensor database for magneto-optical (MO) thin film media in high density MO recording has been established. The measurement method used involves a combination of variable angle ellipsometry, reflection-transmission measurements, and polar Kerr effect measurements. The MULTILAYER program is used to analyze the measurements data and search for the best-estimate values of the unknown parameters. This method, which comprises measurements at a wide range of incident angles and at different wavelengths, provides a high degree of accuracy for characterizing the thickness and the dielectric tensor elements of thin film samples. The wavelength dependence of the dielectric tensor is obtained for the following MO materials: (BiDy)3(FeGa)5O12, MnBi, multilayered Co/Pt, TbFeCoTa, and fcc cobalt. The measurement results for the Heusler alloy PtMnSb, which has been available from the literature, is summarized. In the blue-green regime, the relationship among the derived values of figure of merit for these materials is given.",
author = "Hong Fu and Zheng Yan and Lee, {Seh Kwang} and Masud Mansuripur",
year = "1995",
month = "1",
day = "1",
doi = "10.1063/1.359865",
language = "English (US)",
volume = "78",
pages = "4076--4090",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "6",

}

TY - JOUR

T1 - Dielectric tensor characterization and evaluation of several magneto-optical recording media

AU - Fu, Hong

AU - Yan, Zheng

AU - Lee, Seh Kwang

AU - Mansuripur, Masud

PY - 1995/1/1

Y1 - 1995/1/1

N2 - A dielectric tensor database for magneto-optical (MO) thin film media in high density MO recording has been established. The measurement method used involves a combination of variable angle ellipsometry, reflection-transmission measurements, and polar Kerr effect measurements. The MULTILAYER program is used to analyze the measurements data and search for the best-estimate values of the unknown parameters. This method, which comprises measurements at a wide range of incident angles and at different wavelengths, provides a high degree of accuracy for characterizing the thickness and the dielectric tensor elements of thin film samples. The wavelength dependence of the dielectric tensor is obtained for the following MO materials: (BiDy)3(FeGa)5O12, MnBi, multilayered Co/Pt, TbFeCoTa, and fcc cobalt. The measurement results for the Heusler alloy PtMnSb, which has been available from the literature, is summarized. In the blue-green regime, the relationship among the derived values of figure of merit for these materials is given.

AB - A dielectric tensor database for magneto-optical (MO) thin film media in high density MO recording has been established. The measurement method used involves a combination of variable angle ellipsometry, reflection-transmission measurements, and polar Kerr effect measurements. The MULTILAYER program is used to analyze the measurements data and search for the best-estimate values of the unknown parameters. This method, which comprises measurements at a wide range of incident angles and at different wavelengths, provides a high degree of accuracy for characterizing the thickness and the dielectric tensor elements of thin film samples. The wavelength dependence of the dielectric tensor is obtained for the following MO materials: (BiDy)3(FeGa)5O12, MnBi, multilayered Co/Pt, TbFeCoTa, and fcc cobalt. The measurement results for the Heusler alloy PtMnSb, which has been available from the literature, is summarized. In the blue-green regime, the relationship among the derived values of figure of merit for these materials is given.

UR - http://www.scopus.com/inward/record.url?scp=0029376436&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029376436&partnerID=8YFLogxK

U2 - 10.1063/1.359865

DO - 10.1063/1.359865

M3 - Article

AN - SCOPUS:0029376436

VL - 78

SP - 4076

EP - 4090

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 6

ER -