Dielectric tensor characterization for magneto-optical recording media

Andy F. Zhou, J. Kevin Erwin, Charles F. Brucker, M. Mansuripur

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Abstract

A new and comprehensive dielectric-tensor characterization method was used for the characterization of magneto-optical recording media. The effect of film thickness and bilayer thickness on the magneto-optic Kerr effect was studied for a series of Co-Pd samples. The composition dependencies of the dielectric tensor for both Co-Pt and Co-Pd superlattice samples were measured, and the enhancement of the magneto-optical Kerr effect for these samples was studied.

Original languageEnglish (US)
Pages (from-to)6280-6268
Number of pages13
JournalApplied optics
Volume31
Issue number29
DOIs
StatePublished - Oct 10 1992

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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