Dielectric tensors via non-scanning variable angle ellipsometry

Neil A. Beaudry, Yanming Zhao, Philip McCulloch, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A non-scanning technique for measuring ellipsometric parameters as a function incident and azimuthal angles is presented. This technique is especially suited to measuring the dielectric tensor of arbitrarily oriented biaxial materials.

Original languageEnglish (US)
Title of host publicationOptics InfoBase Conference Papers
PublisherOptical Society of America
ISBN (Print)1557527970, 9781557527974
StatePublished - 2005
EventFrontiers in Optics, FiO 2005 - Tucson, AZ, United States
Duration: Oct 16 2005Oct 21 2005

Other

OtherFrontiers in Optics, FiO 2005
CountryUnited States
CityTucson, AZ
Period10/16/0510/21/05

Fingerprint

Ellipsometry
ellipsometry
Tensors
tensors

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Beaudry, N. A., Zhao, Y., McCulloch, P., & Chipman, R. A. (2005). Dielectric tensors via non-scanning variable angle ellipsometry. In Optics InfoBase Conference Papers Optical Society of America.

Dielectric tensors via non-scanning variable angle ellipsometry. / Beaudry, Neil A.; Zhao, Yanming; McCulloch, Philip; Chipman, Russell A.

Optics InfoBase Conference Papers. Optical Society of America, 2005.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Beaudry, NA, Zhao, Y, McCulloch, P & Chipman, RA 2005, Dielectric tensors via non-scanning variable angle ellipsometry. in Optics InfoBase Conference Papers. Optical Society of America, Frontiers in Optics, FiO 2005, Tucson, AZ, United States, 10/16/05.
Beaudry NA, Zhao Y, McCulloch P, Chipman RA. Dielectric tensors via non-scanning variable angle ellipsometry. In Optics InfoBase Conference Papers. Optical Society of America. 2005
Beaudry, Neil A. ; Zhao, Yanming ; McCulloch, Philip ; Chipman, Russell A. / Dielectric tensors via non-scanning variable angle ellipsometry. Optics InfoBase Conference Papers. Optical Society of America, 2005.
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