Dielectric tensors via non-scanning variable angle ellipsometry

Neil A. Beaudry, Yanming Zhao, Philip McCulloch, Russell Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A non-scanning technique for measuring ellipsometric parameters as a function incident and azimuthal angles is presented. This technique is especially suited to measuring the dielectric tensor of arbitrarily oriented biaxial materials.

Original languageEnglish (US)
Title of host publicationFrontiers in Optics, FiO 2005
PublisherOptical Society of America
ISBN (Print)1557527970, 9781557527974
StatePublished - Jan 1 2005
EventFrontiers in Optics, FiO 2005 - Tucson, AZ, United States
Duration: Oct 16 2005Oct 21 2005

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherFrontiers in Optics, FiO 2005
CountryUnited States
CityTucson, AZ
Period10/16/0510/21/05

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Beaudry, N. A., Zhao, Y., McCulloch, P., & Chipman, R. (2005). Dielectric tensors via non-scanning variable angle ellipsometry. In Frontiers in Optics, FiO 2005 (Optics InfoBase Conference Papers). Optical Society of America.