Diffraction effects in interferometry

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Besides the geometrical errors, interferometry suffers errors due to diffraction, because the wavefront aberrations of the test and reference beams change as they propagate. This paper addresses errors due to diffraction effects in interferometry.

Original languageEnglish (US)
Title of host publicationOptics InfoBase Conference Papers
StatePublished - 2010
EventOptical Fabrication and Testing, OFT 2010 - Jackson Hole, WY, United States
Duration: Jun 13 2010Jun 17 2010

Other

OtherOptical Fabrication and Testing, OFT 2010
CountryUnited States
CityJackson Hole, WY
Period6/13/106/17/10

Fingerprint

Interferometry
interferometry
Diffraction
diffraction
Wavefronts
Aberrations
aberration

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Zhou, P., & Burge, J. H. (2010). Diffraction effects in interferometry. In Optics InfoBase Conference Papers

Diffraction effects in interferometry. / Zhou, Ping; Burge, James H.

Optics InfoBase Conference Papers. 2010.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhou, P & Burge, JH 2010, Diffraction effects in interferometry. in Optics InfoBase Conference Papers. Optical Fabrication and Testing, OFT 2010, Jackson Hole, WY, United States, 6/13/10.
Zhou P, Burge JH. Diffraction effects in interferometry. In Optics InfoBase Conference Papers. 2010
Zhou, Ping ; Burge, James H. / Diffraction effects in interferometry. Optics InfoBase Conference Papers. 2010.
@inproceedings{450b56a1488f42788c52cd4e90009752,
title = "Diffraction effects in interferometry",
abstract = "Besides the geometrical errors, interferometry suffers errors due to diffraction, because the wavefront aberrations of the test and reference beams change as they propagate. This paper addresses errors due to diffraction effects in interferometry.",
author = "Ping Zhou and Burge, {James H}",
year = "2010",
language = "English (US)",
isbn = "9781557528933",
booktitle = "Optics InfoBase Conference Papers",

}

TY - GEN

T1 - Diffraction effects in interferometry

AU - Zhou, Ping

AU - Burge, James H

PY - 2010

Y1 - 2010

N2 - Besides the geometrical errors, interferometry suffers errors due to diffraction, because the wavefront aberrations of the test and reference beams change as they propagate. This paper addresses errors due to diffraction effects in interferometry.

AB - Besides the geometrical errors, interferometry suffers errors due to diffraction, because the wavefront aberrations of the test and reference beams change as they propagate. This paper addresses errors due to diffraction effects in interferometry.

UR - http://www.scopus.com/inward/record.url?scp=84896787115&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84896787115&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9781557528933

BT - Optics InfoBase Conference Papers

ER -