Doppler-shifted self-reflected wave from a semiconductor

Alex Schuelzgen, S. Hughes, Nasser Peyghambarian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report the first experimental observation of a self- reflected wave inside a very dense saturable absorber. An intense femtosecond pulse saturates the absorption and causes a density front moving into the semiconductor sample. Due to the motion of the boundary between saturated and unsaturated areas of the sample the light reflected at this boundary is red-shifted by the Doppler effect. The spectrally shifted reflection makes it possible to distinguish between surface reflection and self-reflection and is used to proof the concept of the dynamic nonlinear skin effect experimentally. Quite well agreement with model calculations is found.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages393-399
Number of pages7
ISBN (Print)0819424056
StatePublished - Dec 1 1997
EventPhysics and Simulation of Optoelectronic Devices V - San Jose, CA, USA
Duration: Feb 10 1997Feb 14 1997

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2994
ISSN (Print)0277-786X

Other

OtherPhysics and Simulation of Optoelectronic Devices V
CitySan Jose, CA, USA
Period2/10/972/14/97

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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