Dual interferometer system for measuring index of refraction

Eric P. Goodwin, John J. Sullivan, Daniel G. Smith, John E Greivenkamp

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Geometrical limitations can sometimes preclude the accurate measurement of the bulk index of refraction. A novel dual interferometer system for measuring the bulk index of thin transparent optical materials is presented.

Original languageEnglish (US)
Title of host publicationOptics InfoBase Conference Papers
PublisherOptical Society of America
ISBN (Print)1557528187, 9781557528186
Publication statusPublished - 2006
EventOptical Fabrication and Testing, OFT 2006 - Rochester, NY, United States
Duration: Oct 10 2006Oct 10 2006

Other

OtherOptical Fabrication and Testing, OFT 2006
CountryUnited States
CityRochester, NY
Period10/10/0610/10/06

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ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Goodwin, E. P., Sullivan, J. J., Smith, D. G., & Greivenkamp, J. E. (2006). Dual interferometer system for measuring index of refraction. In Optics InfoBase Conference Papers Optical Society of America.