Dual interferometer system for measuring index of refraction

Eric P. Goodwin, John J. Sullivan, Daniel G. Smith, John E. Greivenkamp

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Geometrical limitations can sometimes preclude the accurate measurement of the bulk index of refraction. A novel dual interferometer system for measuring the bulk index of thin transparent optical materials is presented.

Original languageEnglish (US)
Title of host publicationOptical Fabrication and Testing, OFT 2006
PublisherOptical Society of America (OSA)
ISBN (Print)1557528187, 9781557528186
DOIs
StatePublished - 2006
EventOptical Fabrication and Testing, OFT 2006 - Rochester, NY, United States
Duration: Oct 10 2006Oct 10 2006

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherOptical Fabrication and Testing, OFT 2006
CountryUnited States
CityRochester, NY
Period10/10/0610/10/06

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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