Dual-mode multi-wavelength snapshot interferometric system for onmachine metrology

Xiaobo Tian, Daodang Wang, Alexander Sohn, Oliver J. Spires, Rongguang Liang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationProceedings - 34th ASPE Annual Meeting
PublisherAmerican Society for Precision Engineering, ASPE
Pages162-165
Number of pages4
ISBN (Electronic)9781887706780
Publication statusPublished - Jan 1 2019
Event34th Annual Meeting of the American Society for Precision Engineering, ASPE 2019 - Pittsburgh, United States
Duration: Oct 28 2019Nov 1 2019

Publication series

NameProceedings - 34th ASPE Annual Meeting

Conference

Conference34th Annual Meeting of the American Society for Precision Engineering, ASPE 2019
CountryUnited States
CityPittsburgh
Period10/28/1911/1/19

ASJC Scopus subject areas

  • Geochemistry and Petrology

Cite this

Tian, X., Wang, D., Sohn, A., Spires, O. J., & Liang, R. (2019). Dual-mode multi-wavelength snapshot interferometric system for onmachine metrology. In Proceedings - 34th ASPE Annual Meeting (pp. 162-165). (Proceedings - 34th ASPE Annual Meeting). American Society for Precision Engineering, ASPE.