Dye aggregates and organic superlattices formed by organic-inorganic molecular beam epitaxy

Neal R Armstrong, K. W. Nebesny, G. E. Collins, L. K. Chau, P. A. Lee, C. England, D. Diehl, M. Douskey, B. A. Parkinson

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

We describe the formation of ordered ultrathin films of chloroindium phthalocyanine (InPcCl) on thin films of the layered semiconductor SnS2, both of which are deposited by a molecular beam epitaxy process to form InPcCl/ SnS2/mica assemblies. The resultant thin films show markedly narrowed linear absorbance spectra versus those seen previously for Pc thin films. Low energy electron diffraction and reflection high energy electron diffraction data collected for the first few monolayers of InPcCl deposited on the SnS2 substrate suggest that three (equally populated) ordered Pc domains are formed, with the Pc rings parallel to the SnS2 surface, aligned along the principle axes of this hcp SnS2 substrate. The red-shift and peak shape of the absorbance spectra of these thin films (about 758 nm, full width at half maximum of about 60 nm) are consistent with the type of splitting of the exciton energies expected of Pc aggregates in which the adjacent Pc rings are cofacial, but staggered in both x and y directions by about half a molecular diameter. This is the structure determined from related trivalent metal Pc's by single crystal X-ray diffraction. Loss of the flat-lying configuration of Pc in these ultrathin films is immediately apparent from the surface electron diffraction data.

Original languageEnglish (US)
Pages (from-to)90-95
Number of pages6
JournalThin Solid Films
Volume216
Issue number1
DOIs
StatePublished - Aug 28 1992
Externally publishedYes

Fingerprint

Superlattices
Molecular beam epitaxy
superlattices
Coloring Agents
molecular beam epitaxy
Dyes
dyes
Thin films
electron diffraction
Ultrathin films
thin films
Electron reflection
Reflection high energy electron diffraction
Low energy electron diffraction
rings
Mica
Substrates
Full width at half maximum
mica
Electron diffraction

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Armstrong, N. R., Nebesny, K. W., Collins, G. E., Chau, L. K., Lee, P. A., England, C., ... Parkinson, B. A. (1992). Dye aggregates and organic superlattices formed by organic-inorganic molecular beam epitaxy. Thin Solid Films, 216(1), 90-95. https://doi.org/10.1016/0040-6090(92)90875-C

Dye aggregates and organic superlattices formed by organic-inorganic molecular beam epitaxy. / Armstrong, Neal R; Nebesny, K. W.; Collins, G. E.; Chau, L. K.; Lee, P. A.; England, C.; Diehl, D.; Douskey, M.; Parkinson, B. A.

In: Thin Solid Films, Vol. 216, No. 1, 28.08.1992, p. 90-95.

Research output: Contribution to journalArticle

Armstrong, NR, Nebesny, KW, Collins, GE, Chau, LK, Lee, PA, England, C, Diehl, D, Douskey, M & Parkinson, BA 1992, 'Dye aggregates and organic superlattices formed by organic-inorganic molecular beam epitaxy', Thin Solid Films, vol. 216, no. 1, pp. 90-95. https://doi.org/10.1016/0040-6090(92)90875-C
Armstrong, Neal R ; Nebesny, K. W. ; Collins, G. E. ; Chau, L. K. ; Lee, P. A. ; England, C. ; Diehl, D. ; Douskey, M. ; Parkinson, B. A. / Dye aggregates and organic superlattices formed by organic-inorganic molecular beam epitaxy. In: Thin Solid Films. 1992 ; Vol. 216, No. 1. pp. 90-95.
@article{bc22110a347c4ddb85283f7ba9f4b66c,
title = "Dye aggregates and organic superlattices formed by organic-inorganic molecular beam epitaxy",
abstract = "We describe the formation of ordered ultrathin films of chloroindium phthalocyanine (InPcCl) on thin films of the layered semiconductor SnS2, both of which are deposited by a molecular beam epitaxy process to form InPcCl/ SnS2/mica assemblies. The resultant thin films show markedly narrowed linear absorbance spectra versus those seen previously for Pc thin films. Low energy electron diffraction and reflection high energy electron diffraction data collected for the first few monolayers of InPcCl deposited on the SnS2 substrate suggest that three (equally populated) ordered Pc domains are formed, with the Pc rings parallel to the SnS2 surface, aligned along the principle axes of this hcp SnS2 substrate. The red-shift and peak shape of the absorbance spectra of these thin films (about 758 nm, full width at half maximum of about 60 nm) are consistent with the type of splitting of the exciton energies expected of Pc aggregates in which the adjacent Pc rings are cofacial, but staggered in both x and y directions by about half a molecular diameter. This is the structure determined from related trivalent metal Pc's by single crystal X-ray diffraction. Loss of the flat-lying configuration of Pc in these ultrathin films is immediately apparent from the surface electron diffraction data.",
author = "Armstrong, {Neal R} and Nebesny, {K. W.} and Collins, {G. E.} and Chau, {L. K.} and Lee, {P. A.} and C. England and D. Diehl and M. Douskey and Parkinson, {B. A.}",
year = "1992",
month = "8",
day = "28",
doi = "10.1016/0040-6090(92)90875-C",
language = "English (US)",
volume = "216",
pages = "90--95",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier",
number = "1",

}

TY - JOUR

T1 - Dye aggregates and organic superlattices formed by organic-inorganic molecular beam epitaxy

AU - Armstrong, Neal R

AU - Nebesny, K. W.

AU - Collins, G. E.

AU - Chau, L. K.

AU - Lee, P. A.

AU - England, C.

AU - Diehl, D.

AU - Douskey, M.

AU - Parkinson, B. A.

PY - 1992/8/28

Y1 - 1992/8/28

N2 - We describe the formation of ordered ultrathin films of chloroindium phthalocyanine (InPcCl) on thin films of the layered semiconductor SnS2, both of which are deposited by a molecular beam epitaxy process to form InPcCl/ SnS2/mica assemblies. The resultant thin films show markedly narrowed linear absorbance spectra versus those seen previously for Pc thin films. Low energy electron diffraction and reflection high energy electron diffraction data collected for the first few monolayers of InPcCl deposited on the SnS2 substrate suggest that three (equally populated) ordered Pc domains are formed, with the Pc rings parallel to the SnS2 surface, aligned along the principle axes of this hcp SnS2 substrate. The red-shift and peak shape of the absorbance spectra of these thin films (about 758 nm, full width at half maximum of about 60 nm) are consistent with the type of splitting of the exciton energies expected of Pc aggregates in which the adjacent Pc rings are cofacial, but staggered in both x and y directions by about half a molecular diameter. This is the structure determined from related trivalent metal Pc's by single crystal X-ray diffraction. Loss of the flat-lying configuration of Pc in these ultrathin films is immediately apparent from the surface electron diffraction data.

AB - We describe the formation of ordered ultrathin films of chloroindium phthalocyanine (InPcCl) on thin films of the layered semiconductor SnS2, both of which are deposited by a molecular beam epitaxy process to form InPcCl/ SnS2/mica assemblies. The resultant thin films show markedly narrowed linear absorbance spectra versus those seen previously for Pc thin films. Low energy electron diffraction and reflection high energy electron diffraction data collected for the first few monolayers of InPcCl deposited on the SnS2 substrate suggest that three (equally populated) ordered Pc domains are formed, with the Pc rings parallel to the SnS2 surface, aligned along the principle axes of this hcp SnS2 substrate. The red-shift and peak shape of the absorbance spectra of these thin films (about 758 nm, full width at half maximum of about 60 nm) are consistent with the type of splitting of the exciton energies expected of Pc aggregates in which the adjacent Pc rings are cofacial, but staggered in both x and y directions by about half a molecular diameter. This is the structure determined from related trivalent metal Pc's by single crystal X-ray diffraction. Loss of the flat-lying configuration of Pc in these ultrathin films is immediately apparent from the surface electron diffraction data.

UR - http://www.scopus.com/inward/record.url?scp=0002661299&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0002661299&partnerID=8YFLogxK

U2 - 10.1016/0040-6090(92)90875-C

DO - 10.1016/0040-6090(92)90875-C

M3 - Article

AN - SCOPUS:0002661299

VL - 216

SP - 90

EP - 95

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 1

ER -