Dynamic memory-based physically unclonable function for the generation of unique identifiers and true random numbers

Christoph Keller, Frank Gurkaynak, Hubert Kaeslin, Norbert Felber

Research output: Chapter in Book/Report/Conference proceedingConference contribution

23 Scopus citations

Abstract

We introduce a test setup for the extraction of unique identifiers and random bits using DRAM. By utilizing standard 512 MByte DDR3 modules, 400 bit/s of random bits can be generated and unique identifiers are extracted. We show that DRAM can be used as a physically unclonable function. In contrast to SRAM-based PUF, DRAM PUF allow for repeated operations without disconnecting supply voltage while still remaining fully functional for normal storage operations.

Original languageEnglish (US)
Title of host publication2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2740-2743
Number of pages4
ISBN (Print)9781479934324
DOIs
StatePublished - Jan 1 2014
Externally publishedYes
Event2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014 - Melbourne, VIC, Australia
Duration: Jun 1 2014Jun 5 2014

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014
CountryAustralia
CityMelbourne, VIC
Period6/1/146/5/14

Keywords

  • Dynamic Memory
  • Physically unclonable Function
  • True Random Number Generation
  • Unique Identifier Generation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Dynamic memory-based physically unclonable function for the generation of unique identifiers and true random numbers'. Together they form a unique fingerprint.

  • Cite this

    Keller, C., Gurkaynak, F., Kaeslin, H., & Felber, N. (2014). Dynamic memory-based physically unclonable function for the generation of unique identifiers and true random numbers. In 2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014 (pp. 2740-2743). [6865740] (Proceedings - IEEE International Symposium on Circuits and Systems). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISCAS.2014.6865740