Dynamic metrology and data processing for precision freeform optics fabrication and testing

Maham Aftab, Isaac Trumper, Lei Huang, Heejoo Choi, Wenchuan Zhao, Logan Graves, Chang Jin Oh, Dae Wook Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Dynamic metrology holds the key to overcoming several challenging limitations of conventional optical metrology, especially with regards to precision freeform optical elements. We present two dynamic metrology systems: 1) adaptive interferometric null testing; and 2) instantaneous phase shifting deflectometry, along with an overview of a gradient data processing and surface reconstruction technique. The adaptive null testing method, utilizing a deformable mirror, adopts a stochastic parallel gradient descent search algorithm in order to dynamically create a null testing condition for unknown freeform optics. The single-shot deflectometry system implemented on an iPhone uses a multiplexed display pattern to enable dynamic measurements of time-varying optical components or optics in vibration. Experimental data, measurement accuracy / precision, and data processing algorithms are discussed.

Original languageEnglish (US)
Title of host publicationFourth European Seminar on Precision Optics Manufacturing
PublisherSPIE
Volume10326
ISBN (Electronic)9781510610972
DOIs
StatePublished - 2017
Event4th European Seminar on Precision Optics Manufacturing - Teisnach, Germany
Duration: Apr 4 2017Apr 5 2017

Other

Other4th European Seminar on Precision Optics Manufacturing
CountryGermany
CityTeisnach
Period4/4/174/5/17

Keywords

  • Data Processing
  • Deflectometry
  • Freeform Optics
  • Metrology
  • Optical Fabrication & Testing
  • Precision Optics

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Aftab, M., Trumper, I., Huang, L., Choi, H., Zhao, W., Graves, L., Oh, C. J., & Kim, D. W. (2017). Dynamic metrology and data processing for precision freeform optics fabrication and testing. In Fourth European Seminar on Precision Optics Manufacturing (Vol. 10326). [103260H] SPIE. https://doi.org/10.1117/12.2272353