Dynamic studies of crystal growth using the AFM

Andrew J. Gratz, Paul E. Hillner, Srinivas Manne, Paul K. Hansma

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Recent advances in AFM technology allow direct observation of solution growth and dissolution (etching) processes important in industry and nature, and direct tests of crystal growth models. We present results of studies of calcite and quartz, including real-time, in situ observations. While both crystals experience layer growth/dissolution, calcite grows by direct addition of material to growth steps without an important contribution from surface diffusion; quartz surfaces are consistent with more traditional, BCF-type growth models. Dynamic AFM observations of growth processes may allow optimization of industrial systems.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages182-185
Number of pages4
ISBN (Print)0819407852
StatePublished - Jan 1 1992
Externally publishedYes
EventScanning Probe Microscopies - Los Angeles, CA, USA
Duration: Jan 20 1992Jan 22 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1639
ISSN (Print)0277-786X

Other

OtherScanning Probe Microscopies
CityLos Angeles, CA, USA
Period1/20/921/22/92

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Gratz, A. J., Hillner, P. E., Manne, S., & Hansma, P. K. (1992). Dynamic studies of crystal growth using the AFM. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 182-185). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1639). Publ by Int Soc for Optical Engineering.