Dynamics of the optical response of Nd:YAG to Ionizing radiation: Testing for radiation hardness using UV laser radiation

B. L. Glebov, K. Simmons-Potter, D. C. Meister

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The optical response of single-crystal Nd:YAG and Cr3+:YAG to ionizing radiation has been previously studied using intense pulses of gamma-rays at the HERMES III facility at Sandia National Laboratory, where samples' transmission at 1064 nm was observed during exposure to gamma radiation. A further study of similar samples when exposed to 10-ns UV laser pulses reveals nearly identical dynamics, with both tests producing similar transient and permanent response in the medium. This strongly suggests that the material response to UV radiation can be used to gauge its gamma-radiation hardness, therefore yielding a material testing technique that is much simpler and less costly than gamma-radiation tests. ·

Original languageEnglish (US)
Title of host publicationOptical Technologies for Arming, Safing, Fuzing, and Firing V
DOIs
StatePublished - 2009
EventOptical Technologies for Arming, Safing, Fuzing, and Firing V - San Diego, CA, United States
Duration: Aug 5 2009Aug 5 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7434
ISSN (Print)0277-786X

Other

OtherOptical Technologies for Arming, Safing, Fuzing, and Firing V
CountryUnited States
CitySan Diego, CA
Period8/5/098/5/09

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Glebov, B. L., Simmons-Potter, K., & Meister, D. C. (2009). Dynamics of the optical response of Nd:YAG to Ionizing radiation: Testing for radiation hardness using UV laser radiation. In Optical Technologies for Arming, Safing, Fuzing, and Firing V [74340B] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7434). https://doi.org/10.1117/12.828443