EASILY TESTABLE STRUCTURE FOR LSI AND VLSI CIRCUITS.

Research output: Contribution to journal › Conference article

Original language	English (US)
Pages (from-to)	346-350
Number of pages	5
Journal	Proceedings of the National Electronics Conference
Volume	36
State	Published - Dec 1 1982
Externally published	Yes

Cite this

@article{b3da2e9147be4321bfca3eed7722b9ad,

title = "EASILY TESTABLE STRUCTURE FOR LSI AND VLSI CIRCUITS.",

author = "Salim Al-Hariri and Fusun Ozguner",

year = "1982",

month = dec,

day = "1",

language = "English (US)",

volume = "36",

pages = "346--350",

journal = "Proceedings of the National Electronics Conference",

issn = "0077-4413",

}

TY - JOUR

T1 - EASILY TESTABLE STRUCTURE FOR LSI AND VLSI CIRCUITS.

AU - Al-Hariri, Salim

AU - Ozguner, Fusun

PY - 1982/12/1

Y1 - 1982/12/1

UR - http://www.scopus.com/inward/record.url?scp=0020302867&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020302867&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0020302867

VL - 36

SP - 346

EP - 350

JO - Proceedings of the National Electronics Conference

JF - Proceedings of the National Electronics Conference

SN - 0077-4413

ER -