EASILY TESTABLE STRUCTURE FOR LSI AND VLSI CIRCUITS.

Salim Al-Hariri, Fusun Ozguner

Research output: Contribution to journalConference article

Original languageEnglish (US)
Pages (from-to)346-350
Number of pages5
JournalProceedings of the National Electronics Conference
Volume36
StatePublished - Dec 1 1982
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

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