Edge tool influence function library using the parametric edge model for computer controlled optical surfacing

Dae Wook Kim, Won Hyun Park, Sug Whan Kim, James H. Burge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

Abstract

Computer controlled optical surfacing (CCOS) requires accurate knowledge of the tool influence function (TIF) for the polishing tool. The linear Preston's model for material removal has been used to determine the TIF for most cases. As the tool runs over the edge of the workpiece, however, nonlinear removal behavior needs to be considered to model the edge TIF. We reported a new parametric edge TIF model in a previous paper.* This model fits 5 parameters to measured data to accurately predict the edge TIF. We present material from the previous paper, and provide a library of the parametric edge TIFs for various tool shape and motion cases. The edge TIF library is a useful reference to design an edge figuring process using a CCOS technique.

Original languageEnglish (US)
Title of host publicationOptical Manufacturing and Testing VIII
DOIs
StatePublished - 2009
EventOptical Manufacturing and Testing VIII - San Diego, CA, United States
Duration: Aug 4 2009Aug 5 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7426
ISSN (Print)0277-786X

Other

OtherOptical Manufacturing and Testing VIII
CountryUnited States
CitySan Diego, CA
Period8/4/098/5/09

Keywords

  • Edge TIF library
  • Edge removal
  • Edge tool influence function
  • Preston's model

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Kim, D. W., Park, W. H., Kim, S. W., & Burge, J. H. (2009). Edge tool influence function library using the parametric edge model for computer controlled optical surfacing. In Optical Manufacturing and Testing VIII [74260G] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7426). https://doi.org/10.1117/12.828499