Effect of curvature on interfacial segregation: electronic contribution to the point defect/interface binding energy

Pierre A Deymier, J. O. Vasseur

Research output: Contribution to journalArticle

Abstract

The electronic contribution to the driving force for segregation to a curved interface between a cylindrical fiber of insulator embedded in a metal matrix is calculated. The solute/curved-interface binding energy is shown to vary as the inverse of the radius of curvature of the interface in the limit of a small radius. This result implies that the propensity for segregation of curved interfaces is larger than that of planar interfaces.

Original languageEnglish (US)
Pages (from-to)147-152
Number of pages6
JournalInterface Science
Volume2
Issue number2
StatePublished - 1994

Fingerprint

Point defects
Binding energy
point defects
binding energy
Metals
curvature
Fibers
electronics
radii
solutes
insulators
fibers
matrices
metals

ASJC Scopus subject areas

  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Effect of curvature on interfacial segregation : electronic contribution to the point defect/interface binding energy. / Deymier, Pierre A; Vasseur, J. O.

In: Interface Science, Vol. 2, No. 2, 1994, p. 147-152.

Research output: Contribution to journalArticle

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