Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films

Finnbarr McCarthy, Kevin McCarthy, Gimtong Teowee, Tracie Bukowski, Tom Alexander, D. R. Uhlmann

Research output: Contribution to journalArticle

Abstract

Sol-gel derived PLZT, including PbTiO3, PbLaTiO3 28, PLZT 9/65/35 and PZT 53/47 films were prepared on platinized substrates. The dielectric and ferroelectric properties of the films were measured at 260K-580K. The values of polarization, coercive field, dielectric constant and dissipation factor in these films typically increased with increasing temperature. The changes in dielectric properties of the films with temperature were not sharp unlike the transitions in single crystals or bulk ceramics. The pyroelectric coefficients, on the other hand, decreased monotonically with increasing temperature in all these films.

Original languageEnglish (US)
Pages (from-to)213-220
Number of pages8
JournalIntegrated Ferroelectrics
Volume17
Issue number1-4
DOIs
StatePublished - Jan 1 1997

Keywords

  • Dielectric
  • PLZT
  • Sol-gel: ferroelectric films
  • Temperature

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Ceramics and Composites
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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