Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films

Finnbarr McCarthy, Kevin McCarthy, Gimtong Teowee, Tracie Bukowski, Tom Alexander, Donald R Uhlmann

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Sol-gel derived PLZT, including PbTiO3, PbLaTiO3 28, PLZT 9/65/35 and PZT 53/47 films were prepared on platinized substrates. The dielectric and ferroelectric properties of the films were measured at 260K-580K. The values of polarization, coercive field, dielectric constant and dissipation factor in these films typically increased with increasing temperature. The changes in dielectric properties of the films with temperature were not sharp unlike the transitions in single crystals or bulk ceramics. The pyroelectric coefficients, on the other hand, decreased monotonically with increasing temperature in all these films.

Original languageEnglish (US)
Title of host publicationIntegrated Ferroelectrics
Pages213-220
Number of pages8
Volume17
Edition1-4
StatePublished - 1997

Fingerprint

Temperature measurement
Ferroelectric materials
Sol-gels
temperature measurement
dielectric properties
gels
Thin films
thin films
Dielectric properties
Temperature
temperature
Permittivity
dissipation
Single crystals
ceramics
Polarization
permittivity
single crystals
Substrates
polarization

Keywords

  • Dielectric
  • PLZT
  • Sol-gel: ferroelectric films
  • Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy (miscellaneous)
  • Condensed Matter Physics

Cite this

McCarthy, F., McCarthy, K., Teowee, G., Bukowski, T., Alexander, T., & Uhlmann, D. R. (1997). Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films. In Integrated Ferroelectrics (1-4 ed., Vol. 17, pp. 213-220)

Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films. / McCarthy, Finnbarr; McCarthy, Kevin; Teowee, Gimtong; Bukowski, Tracie; Alexander, Tom; Uhlmann, Donald R.

Integrated Ferroelectrics. Vol. 17 1-4. ed. 1997. p. 213-220.

Research output: Chapter in Book/Report/Conference proceedingChapter

McCarthy, F, McCarthy, K, Teowee, G, Bukowski, T, Alexander, T & Uhlmann, DR 1997, Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films. in Integrated Ferroelectrics. 1-4 edn, vol. 17, pp. 213-220.
McCarthy F, McCarthy K, Teowee G, Bukowski T, Alexander T, Uhlmann DR. Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films. In Integrated Ferroelectrics. 1-4 ed. Vol. 17. 1997. p. 213-220
McCarthy, Finnbarr ; McCarthy, Kevin ; Teowee, Gimtong ; Bukowski, Tracie ; Alexander, Tom ; Uhlmann, Donald R. / Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films. Integrated Ferroelectrics. Vol. 17 1-4. ed. 1997. pp. 213-220
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