Effect of oxide layer thickness on polarization mitigation

Suchandra Banerjee, Russell A Chipman, Nathan Hagen, Yukitoshi Otani

Research output: Contribution to journalConference article

Abstract

We analyze the influence of oxide layer thickness on polarization cancellation using crossed fold mirrors. We measure the linear retardance of three individual aluminum coated mirrors over the visible to near infra-red region by employing a spectroscopic Mueller matrix polarimeter. By fitting the measured linear retardance data with the theoretical model described by Fresnel's law, the native oxide layer thickness of three mirrors are determined as 4.40 nm, 5.75 nm, and 4.10 nm respectively. We perform polarization cancellation by using crossed fold mirrors. The oxide layer thickness difference of 1.35 nm between the first two mirrors limits the polarization cancellation to 0.65° of retardance at 650 nm. We show that the first and last fold mirrors having nearly same amount of oxide layer thickness reduces the residual quantity to 0.15° at 650 nm.

Original languageEnglish (US)
Article numberOPTM-6-05
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume11142
StatePublished - Jan 1 2019
EventOptical Technology and Measurement for Industrial Applications Conference 2019 - Yokohama, Japan
Duration: Apr 22 2019Apr 26 2019

Keywords

  • Crossed fold mirrors
  • Linear retardance
  • Mueller matrix polarimeter
  • Oxide layer
  • Polarization

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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