Effect of surface charge and fluid properties on particle removal characteristics of a surface-optimized REB filter

Wayne P. Kelly, Donald C. Grant, Joseph Zahka, Wayne Huang, Srini Raghavan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationSolid State Phenomena
PublisherTrans Tech Publications Ltd
Pages271-274
Number of pages4
Volume76-77
ISBN (Print)9783908450573
DOIs
StatePublished - 2001
Event5th International Symposium on Ultra Clean Processing of Silicon Surfaces, UCPSS 2000 - Ostend, Belgium
Duration: Sep 18 2000Sep 20 2000

Publication series

NameSolid State Phenomena
Volume76-77
ISSN (Electronic)16629779

Other

Other5th International Symposium on Ultra Clean Processing of Silicon Surfaces, UCPSS 2000
CountryBelgium
CityOstend
Period9/18/009/20/00

Fingerprint

Zeta potential
Surface charge
Fluids

Keywords

  • Filters
  • Retention
  • Zeta potential

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics

Cite this

Kelly, W. P., Grant, D. C., Zahka, J., Huang, W., & Raghavan, S. (2001). Effect of surface charge and fluid properties on particle removal characteristics of a surface-optimized REB filter. In Solid State Phenomena (Vol. 76-77, pp. 271-274). (Solid State Phenomena; Vol. 76-77). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scienific.net/SSP.76-77.271

Effect of surface charge and fluid properties on particle removal characteristics of a surface-optimized REB filter. / Kelly, Wayne P.; Grant, Donald C.; Zahka, Joseph; Huang, Wayne; Raghavan, Srini.

Solid State Phenomena. Vol. 76-77 Trans Tech Publications Ltd, 2001. p. 271-274 (Solid State Phenomena; Vol. 76-77).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kelly, WP, Grant, DC, Zahka, J, Huang, W & Raghavan, S 2001, Effect of surface charge and fluid properties on particle removal characteristics of a surface-optimized REB filter. in Solid State Phenomena. vol. 76-77, Solid State Phenomena, vol. 76-77, Trans Tech Publications Ltd, pp. 271-274, 5th International Symposium on Ultra Clean Processing of Silicon Surfaces, UCPSS 2000, Ostend, Belgium, 9/18/00. https://doi.org/10.4028/www.scienific.net/SSP.76-77.271
Kelly WP, Grant DC, Zahka J, Huang W, Raghavan S. Effect of surface charge and fluid properties on particle removal characteristics of a surface-optimized REB filter. In Solid State Phenomena. Vol. 76-77. Trans Tech Publications Ltd. 2001. p. 271-274. (Solid State Phenomena). https://doi.org/10.4028/www.scienific.net/SSP.76-77.271
Kelly, Wayne P. ; Grant, Donald C. ; Zahka, Joseph ; Huang, Wayne ; Raghavan, Srini. / Effect of surface charge and fluid properties on particle removal characteristics of a surface-optimized REB filter. Solid State Phenomena. Vol. 76-77 Trans Tech Publications Ltd, 2001. pp. 271-274 (Solid State Phenomena).
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