Effective permittivity and scattering model for the evaluation of the leaf water status

Maik A Scheller, C. Jördens, B. Breitenstein, D. Selmar, M. Koch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

An electromagnetic model of plant leaves at THz frequencies is presented. It allows for the determination of the leaf water status. The model bases on an effective medium theory and extends the model by Landau, Lifshitz, and Looyenga. The influence of scattering, which is dominant at higher frequencies, is described by a Rayleigh roughness factor. Results of THz time-domain spectroscopy measurements on Coffea arabica leaves are used to validate the model.

Original languageEnglish (US)
Title of host publication33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
DOIs
StatePublished - 2008
Externally publishedYes
Event33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008 - Pasadena, CA, United States
Duration: Sep 15 2008Sep 19 2008

Other

Other33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
CountryUnited States
CityPasadena, CA
Period9/15/089/19/08

Fingerprint

Permittivity
Scattering
Water
Surface roughness
Spectroscopy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Scheller, M. A., Jördens, C., Breitenstein, B., Selmar, D., & Koch, M. (2008). Effective permittivity and scattering model for the evaluation of the leaf water status. In 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008 [4665826] https://doi.org/10.1109/ICIMW.2008.4665826

Effective permittivity and scattering model for the evaluation of the leaf water status. / Scheller, Maik A; Jördens, C.; Breitenstein, B.; Selmar, D.; Koch, M.

33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008. 2008. 4665826.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scheller, MA, Jördens, C, Breitenstein, B, Selmar, D & Koch, M 2008, Effective permittivity and scattering model for the evaluation of the leaf water status. in 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008., 4665826, 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008, Pasadena, CA, United States, 9/15/08. https://doi.org/10.1109/ICIMW.2008.4665826
Scheller MA, Jördens C, Breitenstein B, Selmar D, Koch M. Effective permittivity and scattering model for the evaluation of the leaf water status. In 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008. 2008. 4665826 https://doi.org/10.1109/ICIMW.2008.4665826
Scheller, Maik A ; Jördens, C. ; Breitenstein, B. ; Selmar, D. ; Koch, M. / Effective permittivity and scattering model for the evaluation of the leaf water status. 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008. 2008.
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