Efficient statistical analysis of microwave circuit performance using design of experiments

Kathleen Virga, Robert J. Engelhardt

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

Variations of circuit dimensions and material parameters about their normal values result in microwave circuits that do not perform as expected. This paper describes how the method of design of experiments (DOE) may be used with circuit simulations to statistically characterize the effects that variations of these circuit factors have on circuit performance. The results of a study that uses DOE for the reflection coefficient performance of an antenna radiator circuit are presented.

Original languageEnglish (US)
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
PublisherPubl by IEEE
Pages123-126
Number of pages4
ISBN (Print)0780312090
StatePublished - Jan 1 1993
Externally publishedYes
EventProceedings of the 1993 IEEE MTT-S International Microwave Symposium Digest, Part 1 (of 3) - Atlanta, GA, USA
Duration: Jun 14 1993Jun 18 1993

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
Volume1
ISSN (Print)0149-645X

Conference

ConferenceProceedings of the 1993 IEEE MTT-S International Microwave Symposium Digest, Part 1 (of 3)
CityAtlanta, GA, USA
Period6/14/936/18/93

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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