Electric field effects on micro-channel electrophoresis

Chun Wei Cheung, S. K. Kwok, W. H. Lee, Yitshak Zohar, M. Wong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Though the area occupied by a micro-channel electrophoresis system can be reduced using serpentine channels, bend-induced loss of resolution due to plug lengthening in the direction of separation is observed. In the present work, electrophoresis is described as an electric field driven, dispersive drift process in a distributed resistive system. The distortion and lengthening of a plug around a bend are explained in terms of a geometry-induced non-uniform redistribution of the electric field lines.

Original languageEnglish (US)
Title of host publicationTRANSDUCERS 2003 - 12th International Conference on Solid-State Sensors, Actuators and Microsystems, Digest of Technical Papers
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1891-1894
Number of pages4
Volume2
ISBN (Print)0780377311, 9780780377318
DOIs
StatePublished - 2003
Externally publishedYes
Event12th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2003 - Digest of Technical Papers - Boston, United States
Duration: Jun 8 2003Jun 12 2003

Other

Other12th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2003 - Digest of Technical Papers
CountryUnited States
CityBoston
Period6/8/036/12/03

Keywords

  • Dispersion
  • DNA
  • Electrokinetics
  • Etching
  • Geometry
  • Glass
  • Mechanical engineering
  • Nonuniform electric fields
  • Plugs
  • Silicon

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Cheung, C. W., Kwok, S. K., Lee, W. H., Zohar, Y., & Wong, M. (2003). Electric field effects on micro-channel electrophoresis. In TRANSDUCERS 2003 - 12th International Conference on Solid-State Sensors, Actuators and Microsystems, Digest of Technical Papers (Vol. 2, pp. 1891-1894). [1217160] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SENSOR.2003.1217160