Abstract
This paper presents a measurement of the electro-optic coefficient of CdTe. It is shown that electro-optic properties are constant in the range 8-14 μm, except for a small dip in the response near the absorption band around 6 μm. Measured Meuller matrix spectra are used for determination of retardance as a function of voltage and wavelength. The matrix spectra allows complete characterization of polarization properties including diattenuation, retardance and depolarization.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 7382-7389 |
| Number of pages | 8 |
| Journal | Applied Optics |
| Volume | 33 |
| Issue number | 31 |
| State | Published - Nov 1 1994 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
Cite this
Electro-optic coefficient spectrum of cadmium telluride. / Chenault, David B.; Chipman, Russell A; Shih-Yau, Lu.
In: Applied Optics, Vol. 33, No. 31, 01.11.1994, p. 7382-7389.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Electro-optic coefficient spectrum of cadmium telluride
AU - Chenault, David B.
AU - Chipman, Russell A
AU - Shih-Yau, Lu
PY - 1994/11/1
Y1 - 1994/11/1
N2 - This paper presents a measurement of the electro-optic coefficient of CdTe. It is shown that electro-optic properties are constant in the range 8-14 μm, except for a small dip in the response near the absorption band around 6 μm. Measured Meuller matrix spectra are used for determination of retardance as a function of voltage and wavelength. The matrix spectra allows complete characterization of polarization properties including diattenuation, retardance and depolarization.
AB - This paper presents a measurement of the electro-optic coefficient of CdTe. It is shown that electro-optic properties are constant in the range 8-14 μm, except for a small dip in the response near the absorption band around 6 μm. Measured Meuller matrix spectra are used for determination of retardance as a function of voltage and wavelength. The matrix spectra allows complete characterization of polarization properties including diattenuation, retardance and depolarization.
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UR - http://www.scopus.com/inward/citedby.url?scp=0028545564&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0028545564
VL - 33
SP - 7382
EP - 7389
JO - Applied Optics
JF - Applied Optics
SN - 1559-128X
IS - 31
ER -