Electro-optic spatial light modulator characterization using Mueller matrix imaging

Elizabeth A. Sornsin, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A series of electro-optic spatial light modulators have been measured with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in a device with lead-lanthanum-zirconate-titanate (PLZT 9/65/35) modulating material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 × 10-16 (m/V)2 was determined in the modulator active regions.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsD.H. Goldstein, R.A. Chipman
Pages161-166
Number of pages6
Volume3121
DOIs
StatePublished - 1997
Externally publishedYes
EventPolarization: Measurement, Analysis, and Remote Sensing - San Diego, CA, United States
Duration: Jul 30 1997Aug 1 1997

Other

OtherPolarization: Measurement, Analysis, and Remote Sensing
CountryUnited States
CitySan Diego, CA
Period7/30/978/1/97

Fingerprint

Polarimeters
polarimeters
Electrooptical effects
light modulators
electro-optics
Imaging techniques
matrices
retarders
electric field strength
Lanthanum
lanthanum
Modulators
modulators
Lead
Electric fields
Electric potential
electric potential
coefficients
Spatial light modulators

Keywords

  • Imaging polarimetry
  • Mueller matrix
  • PLZT
  • Retardance

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Sornsin, E. A., & Chipman, R. A. (1997). Electro-optic spatial light modulator characterization using Mueller matrix imaging. In D. H. Goldstein, & R. A. Chipman (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3121, pp. 161-166) https://doi.org/10.1117/12.278966

Electro-optic spatial light modulator characterization using Mueller matrix imaging. / Sornsin, Elizabeth A.; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / D.H. Goldstein; R.A. Chipman. Vol. 3121 1997. p. 161-166.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sornsin, EA & Chipman, RA 1997, Electro-optic spatial light modulator characterization using Mueller matrix imaging. in DH Goldstein & RA Chipman (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 3121, pp. 161-166, Polarization: Measurement, Analysis, and Remote Sensing, San Diego, CA, United States, 7/30/97. https://doi.org/10.1117/12.278966
Sornsin EA, Chipman RA. Electro-optic spatial light modulator characterization using Mueller matrix imaging. In Goldstein DH, Chipman RA, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3121. 1997. p. 161-166 https://doi.org/10.1117/12.278966
Sornsin, Elizabeth A. ; Chipman, Russell A. / Electro-optic spatial light modulator characterization using Mueller matrix imaging. Proceedings of SPIE - The International Society for Optical Engineering. editor / D.H. Goldstein ; R.A. Chipman. Vol. 3121 1997. pp. 161-166
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