Electro-optical characterization of Pb(Zr,Ti)O3 thin films by waveguide refractometry

Barrett G Potter, M. B. Sinclair, D. Dimos

Research output: Contribution to journalArticle

38 Citations (Scopus)

Abstract

Electric field-induced changes in the extraordinary and ordinary refractive indices of a Pb(Zr0.53Ti0.47)O3 thin film were independently determined using waveguide refractometry. Under an electric field, applied normal to the film plane and corresponding to saturation of the electric polarization, the ratio of the extraordinary to ordinary refractive index change (Δne/Δno) is found to be -4/1, contributing to a net birefringence change [Δ(ne-n o)] of -0.021. Using this technique, both diagonal and off-diagonal elements of the electro-optic response tensor describing the macroscopic behavior of the polycrystalline film were accessed, illustrating the importance of this approach in evaluating orientation-specific electro-optic characteristics in these films.

Original languageEnglish (US)
Pages (from-to)2180-2182
Number of pages3
JournalApplied Physics Letters
Volume63
Issue number16
DOIs
StatePublished - 1993
Externally publishedYes

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waveguides
electro-optics
thin films
refractivity
electric fields
birefringence
tensors
saturation
polarization

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Electro-optical characterization of Pb(Zr,Ti)O3 thin films by waveguide refractometry. / Potter, Barrett G; Sinclair, M. B.; Dimos, D.

In: Applied Physics Letters, Vol. 63, No. 16, 1993, p. 2180-2182.

Research output: Contribution to journalArticle

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