Electro-optical characterization of Pb(Zr,Ti)O3 thin films by waveguide refractometry

B. G. Potter, M. B. Sinclair, D. Dimos

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Abstract

Electric field-induced changes in the extraordinary and ordinary refractive indices of a Pb(Zr0.53Ti0.47)O3 thin film were independently determined using waveguide refractometry. Under an electric field, applied normal to the film plane and corresponding to saturation of the electric polarization, the ratio of the extraordinary to ordinary refractive index change (Δne/Δno) is found to be -4/1, contributing to a net birefringence change [Δ(ne-n o)] of -0.021. Using this technique, both diagonal and off-diagonal elements of the electro-optic response tensor describing the macroscopic behavior of the polycrystalline film were accessed, illustrating the importance of this approach in evaluating orientation-specific electro-optic characteristics in these films.

Original languageEnglish (US)
Pages (from-to)2180-2182
Number of pages3
JournalApplied Physics Letters
Volume63
Issue number16
DOIs
StatePublished - Dec 1 1993
Externally publishedYes

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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