ELECTRO-OPTICAL CHARACTERIZATION OF THE TEKTRONIX TK512M-011 CHARGE-COUPLED DEVICE.

Patrick M. Epperson, Jonathan V. Sweedler, M Bonner Denton, Gary R. Sims, Thomas W. McCurnin, Richard S. Aikens

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

The electro-optical characterization of the first in a new series of Tektronix CCDs is described. This device, the TK512M-011, is a frontside-illuminated CCD with a 512 by 512 format and 27 by 27 mu m pixels. Electro-optical characteristics measured in this study include linearity, blooming, dark count rate, charge-transfer efficiency (CTE), and quantum efficiency. The results of a detailed study of the noise characteristics of the CCD output FET are reported. The TK512M-011 has excellent photometric linearity, high well capacity, and a low dark count rate. Very good low light level CTE is observed in the parallel shift direction; however, CTE problems are observed in the serial direction. The quantum efficiency of the front-side-illuminated CCD over the wavelength range of 400 to 1000 nm is lower than expected based on experience with similar devices. The noise of the output FET of the CCD is equivalent to 5 to 12 electrons, depending on the FET operating conditions and system bandwidth.

Original languageEnglish (US)
Pages (from-to)715-724
Number of pages10
JournalOptical Engineering
Volume26
Issue number8
StatePublished - Aug 1987

Fingerprint

Charge coupled devices
charge coupled devices
Field effect transistors
Charge transfer
field effect transistors
charge transfer
Quantum efficiency
linearity
quantum efficiency
output
format
Pixels
pixels
bandwidth
Bandwidth
Wavelength
Electrons
shift
wavelengths
electrons

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Epperson, P. M., Sweedler, J. V., Denton, M. B., Sims, G. R., McCurnin, T. W., & Aikens, R. S. (1987). ELECTRO-OPTICAL CHARACTERIZATION OF THE TEKTRONIX TK512M-011 CHARGE-COUPLED DEVICE. Optical Engineering, 26(8), 715-724.

ELECTRO-OPTICAL CHARACTERIZATION OF THE TEKTRONIX TK512M-011 CHARGE-COUPLED DEVICE. / Epperson, Patrick M.; Sweedler, Jonathan V.; Denton, M Bonner; Sims, Gary R.; McCurnin, Thomas W.; Aikens, Richard S.

In: Optical Engineering, Vol. 26, No. 8, 08.1987, p. 715-724.

Research output: Contribution to journalArticle

Epperson, PM, Sweedler, JV, Denton, MB, Sims, GR, McCurnin, TW & Aikens, RS 1987, 'ELECTRO-OPTICAL CHARACTERIZATION OF THE TEKTRONIX TK512M-011 CHARGE-COUPLED DEVICE.', Optical Engineering, vol. 26, no. 8, pp. 715-724.
Epperson PM, Sweedler JV, Denton MB, Sims GR, McCurnin TW, Aikens RS. ELECTRO-OPTICAL CHARACTERIZATION OF THE TEKTRONIX TK512M-011 CHARGE-COUPLED DEVICE. Optical Engineering. 1987 Aug;26(8):715-724.
Epperson, Patrick M. ; Sweedler, Jonathan V. ; Denton, M Bonner ; Sims, Gary R. ; McCurnin, Thomas W. ; Aikens, Richard S. / ELECTRO-OPTICAL CHARACTERIZATION OF THE TEKTRONIX TK512M-011 CHARGE-COUPLED DEVICE. In: Optical Engineering. 1987 ; Vol. 26, No. 8. pp. 715-724.
@article{afb0a306a31743c6ac28be872609b3a3,
title = "ELECTRO-OPTICAL CHARACTERIZATION OF THE TEKTRONIX TK512M-011 CHARGE-COUPLED DEVICE.",
abstract = "The electro-optical characterization of the first in a new series of Tektronix CCDs is described. This device, the TK512M-011, is a frontside-illuminated CCD with a 512 by 512 format and 27 by 27 mu m pixels. Electro-optical characteristics measured in this study include linearity, blooming, dark count rate, charge-transfer efficiency (CTE), and quantum efficiency. The results of a detailed study of the noise characteristics of the CCD output FET are reported. The TK512M-011 has excellent photometric linearity, high well capacity, and a low dark count rate. Very good low light level CTE is observed in the parallel shift direction; however, CTE problems are observed in the serial direction. The quantum efficiency of the front-side-illuminated CCD over the wavelength range of 400 to 1000 nm is lower than expected based on experience with similar devices. The noise of the output FET of the CCD is equivalent to 5 to 12 electrons, depending on the FET operating conditions and system bandwidth.",
author = "Epperson, {Patrick M.} and Sweedler, {Jonathan V.} and Denton, {M Bonner} and Sims, {Gary R.} and McCurnin, {Thomas W.} and Aikens, {Richard S.}",
year = "1987",
month = "8",
language = "English (US)",
volume = "26",
pages = "715--724",
journal = "Optical Engineering",
issn = "0091-3286",
publisher = "SPIE",
number = "8",

}

TY - JOUR

T1 - ELECTRO-OPTICAL CHARACTERIZATION OF THE TEKTRONIX TK512M-011 CHARGE-COUPLED DEVICE.

AU - Epperson, Patrick M.

AU - Sweedler, Jonathan V.

AU - Denton, M Bonner

AU - Sims, Gary R.

AU - McCurnin, Thomas W.

AU - Aikens, Richard S.

PY - 1987/8

Y1 - 1987/8

N2 - The electro-optical characterization of the first in a new series of Tektronix CCDs is described. This device, the TK512M-011, is a frontside-illuminated CCD with a 512 by 512 format and 27 by 27 mu m pixels. Electro-optical characteristics measured in this study include linearity, blooming, dark count rate, charge-transfer efficiency (CTE), and quantum efficiency. The results of a detailed study of the noise characteristics of the CCD output FET are reported. The TK512M-011 has excellent photometric linearity, high well capacity, and a low dark count rate. Very good low light level CTE is observed in the parallel shift direction; however, CTE problems are observed in the serial direction. The quantum efficiency of the front-side-illuminated CCD over the wavelength range of 400 to 1000 nm is lower than expected based on experience with similar devices. The noise of the output FET of the CCD is equivalent to 5 to 12 electrons, depending on the FET operating conditions and system bandwidth.

AB - The electro-optical characterization of the first in a new series of Tektronix CCDs is described. This device, the TK512M-011, is a frontside-illuminated CCD with a 512 by 512 format and 27 by 27 mu m pixels. Electro-optical characteristics measured in this study include linearity, blooming, dark count rate, charge-transfer efficiency (CTE), and quantum efficiency. The results of a detailed study of the noise characteristics of the CCD output FET are reported. The TK512M-011 has excellent photometric linearity, high well capacity, and a low dark count rate. Very good low light level CTE is observed in the parallel shift direction; however, CTE problems are observed in the serial direction. The quantum efficiency of the front-side-illuminated CCD over the wavelength range of 400 to 1000 nm is lower than expected based on experience with similar devices. The noise of the output FET of the CCD is equivalent to 5 to 12 electrons, depending on the FET operating conditions and system bandwidth.

UR - http://www.scopus.com/inward/record.url?scp=0023401908&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023401908&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0023401908

VL - 26

SP - 715

EP - 724

JO - Optical Engineering

JF - Optical Engineering

SN - 0091-3286

IS - 8

ER -