Electron-beam-induced structural changes in crystalline C60 and C70

Supapan Seraphin, Dan Zhou, Jun Jiao

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

High-resolution transmission electron microscopy (HRTEM), electron diffraction, and electron energy-loss spectroscopy (EELS) were used to characterize electron-beam-induced structural transformations in crystalline samples of C60 and C70. During these transformations, the electron-diffraction patterns became progressively more diffuse, with the outer diffraction spots disappearing first, followed in succession by the disappearance of the inner spots. We interpret this course of evolution in the diffraction patterns as evidence of degradation of the crystalline structure via the destruction of individual molecules, as opposed to electron-beam-induced motion of intact fullerene molecules. EELS analyses of the data indicate that the final state of these transformations was amorphous carbon.

Original languageEnglish (US)
Pages (from-to)1895-1899
Number of pages5
JournalJournal of Materials Research
Volume8
Issue number8
StatePublished - Aug 1993

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Electron energy loss spectroscopy
Electron diffraction
Diffraction patterns
Electron beams
electron beams
Crystalline materials
Fullerenes
Molecules
Amorphous carbon
diffraction patterns
electron diffraction
High resolution transmission electron microscopy
energy dissipation
electron energy
Diffraction
Degradation
spectroscopy
destruction
fullerenes
molecules

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Electron-beam-induced structural changes in crystalline C60 and C70. / Seraphin, Supapan; Zhou, Dan; Jiao, Jun.

In: Journal of Materials Research, Vol. 8, No. 8, 08.1993, p. 1895-1899.

Research output: Contribution to journalArticle

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