Electronic contribution to the point defect/curved-interface binding energy. Effect on segregation of curved interfaces

Pierre A Deymier, JO O. Vasseur

Research output: Contribution to journalArticle

Abstract

The electronic contribution to the driving force for segregation to a curved-interface between a cylindrical fiber of insulator embedded in a metal matrix is calculated. The solute/curved-interface binding energy is shown to vary as the inverse of the radius of curvature of the interface in the limit of a small radius. This result implies that the propensity for segregation of curved interfaces is larger than that of planar interfaces.

Original languageEnglish (US)
Pages (from-to)517-521
Number of pages5
JournalVacuum
Volume46
Issue number5-6
DOIs
StatePublished - 1995

Fingerprint

Point defects
Binding energy
point defects
binding energy
Metals
Fibers
electronics
radii
solutes
curvature
insulators
fibers
matrices
metals

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Instrumentation
  • Surfaces and Interfaces

Cite this

Electronic contribution to the point defect/curved-interface binding energy. Effect on segregation of curved interfaces. / Deymier, Pierre A; Vasseur, JO O.

In: Vacuum, Vol. 46, No. 5-6, 1995, p. 517-521.

Research output: Contribution to journalArticle

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