Elemental analysis with a plasma emission echelle spectrometer employing a charge injection device (CID) detector

R. B. Bilhorn, M. B. Denton

Research output: Contribution to journalArticle

32 Scopus citations

Abstract

An atomic emission spectrometer which allows simultaneous high-precision digital recording of the ultraviolet spectrum has been developed. The instrument employs both a custom-built echelle spectrometer and a custom-built slow-scan charge injection device (CID) based detector system. The system is capable of measuring the wide dynamic range of signal intensities associated with plasma emission sources, and sensitivity is comparable to that of photomultiplier-tube-equipped instruments. Unprecedented speed and flexibility for elemental analysis are provided by the ability to display background-subtracted emission spectra and to have the computer assist in spectral line identification.

Original languageEnglish (US)
Pages (from-to)1-11
Number of pages11
JournalApplied Spectroscopy
Volume43
Issue number1
DOIs
StatePublished - Jan 1 1989

ASJC Scopus subject areas

  • Instrumentation
  • Spectroscopy

Fingerprint Dive into the research topics of 'Elemental analysis with a plasma emission echelle spectrometer employing a charge injection device (CID) detector'. Together they form a unique fingerprint.

  • Cite this