Emerging technology for astronomical optics metrology

Isaac Trumper, Buell Tomasson Jannuzi, Dae Wook Kim

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Next generation astronomical optics will enable science discoveries across all fields and impact the way we perceive the Universe in which we live. To build these systems, optical metrology tools have been developed that push the boundary of what is possible. We present a summary of a few key metrology technologies that we believe are critical for the coming generation of optical surfaces.

Original languageEnglish (US)
JournalOptics and Lasers in Engineering
DOIs
StateAccepted/In press - 2017

Fingerprint

metrology
emerging
Optics
optics
Optical systems
universe

Keywords

  • Astronomical optics
  • Instrumentation
  • Metrology
  • Optical testing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Cite this

Emerging technology for astronomical optics metrology. / Trumper, Isaac; Jannuzi, Buell Tomasson; Kim, Dae Wook.

In: Optics and Lasers in Engineering, 2017.

Research output: Contribution to journalArticle

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