End-to-end simulation of the SCALES integral field spectrograph

Zackery Briesemeister, Steph Sallum, Andrew Skemer, R. Deno Stelter, Philip Hinz, Timothy Brandt

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We present end-to-end simulations of SCALES, the third generation thermal-infrared diffraction limited imager and low/med-resolution integral field spectrograph (IFS) being designed for Keck. The 2-5 micron sensitivity of SCALES enables detection and characterization of a wide variety of exoplanets, including exoplanets detected through long-baseline astrometry, radial-velocity planets on wide orbits, accreting protoplanets in nearby star-forming regions, and reflected-light planets around the nearest stars. The simulation goal is to generate high-fidelity mock data to assess the scientific capabilities of the SCALES instrument at current and future design stages. The simulation processes arbitrary-resolution input intensity fields with a proposed observation pattern into an entire mock dataset of raw detector read-out lenslet-based IFS frames with calibrations and metadata, which are then reduced by the IFS data reduction pipeline to be analyzed by the user.

Original languageEnglish (US)
Title of host publicationGround-Based and Airborne Instrumentation for Astronomy VIII
EditorsChristopher J. Evans, Julia J. Bryant, Kentaro Motohara
ISBN (Electronic)9781510636811
StatePublished - 2020
Externally publishedYes
EventGround-Based and Airborne Instrumentation for Astronomy VIII 2020 - Virtual, Online, United States
Duration: Dec 14 2020Dec 22 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceGround-Based and Airborne Instrumentation for Astronomy VIII 2020
Country/TerritoryUnited States
CityVirtual, Online


  • Instrumentation: high angular resolution
  • Integral field spectroscopy
  • Simulation
  • Thermal infrared

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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