Enhancement of lateral resolution in confocal self-interference microscopy

Dong Kyun Kang, Dae Gab Gweon

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

We describe confocal self-interference microscopy with enhanced lateral resolution. A uniaxial anisotropic crystal is used to cause interference between two linearly polarized beams that are reflected from the same pointlike object in the focal plane of the objective lens. Theory and the optimal design that maximizes the sensitivity of the interference signal are presented. A numerical experiment shows a 38% decrease in the lateral FWHM for simple confocal self-interference microscopy.

Original languageEnglish (US)
Pages (from-to)2470-2472
Number of pages3
JournalOptics letters
Volume28
Issue number24
DOIs
StatePublished - Dec 15 2003
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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