Equivalent accelerated life testing plans for log-location-scale distributions

Haitao Liao, Elsayed A. Elsayed

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

Accelerated life testing (ALT) is widely used to determine the failure time distribution of a product and the associated life-stress relationship in order to predict the product's reliability under normal operating conditions. Many types of stress loadingssuch as constant-stress, step-stress and cyclic-stress can be utilized when conducting ALT. Extensive research has been conducted on the analysis of ALT data obtained under a specified stress loading. However, the equivalency of ALT experiments involving different stress loadings has not been investigated. In this article, a log-location-scale distribution under Type I censoring is considered in planning ALT. An idea is provided for the equivalency of various ALT plans involving different stress loadings. Based on this idea, general equivalent ALT plans and some special types of equivalent ALT plans are explored. For demonstration, a constant-stress ALT and a ramp-stress ALT for miniature lamps are presented and their equivalency is investigated.

Original languageEnglish (US)
Pages (from-to)472-488
Number of pages17
JournalNaval Research Logistics
Volume57
Issue number5
DOIs
StatePublished - Aug 2010
Externally publishedYes

Fingerprint

Accelerated Life Testing
Testing
Type I Censoring
Failure Time
Electric lamps
Demonstrations
Planning

Keywords

  • Equivalency
  • Log-location-scale distributions
  • Optimal ALT plans
  • Type I censoring

ASJC Scopus subject areas

  • Ocean Engineering
  • Modeling and Simulation
  • Management Science and Operations Research

Cite this

Equivalent accelerated life testing plans for log-location-scale distributions. / Liao, Haitao; Elsayed, Elsayed A.

In: Naval Research Logistics, Vol. 57, No. 5, 08.2010, p. 472-488.

Research output: Contribution to journalArticle

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