Estimation of errors in partial Mueller matrix polarimeter calibration

Andrey S. Alenin, Israel J. Vaughn, J. Scott Tyo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

While active polarimeters have been shown to be successful at improving discriminability of the targets of interest from their background in a wide range of applications, their use can be problematic for cases with strong bandwidth constraints. In order to limit the number of performed measurements, a number of successive studies have developed the concept of partial Mueller matrix polarimeters (pMMPs) into a competitive solution. Like all systems, pMMPs need to be calibrated in order to yield accurate results. In this treatment we provide a method by which to select a limited number of reference objects to calibrate a given pMMP design. To demonstrate the efficacy of the approach, we apply the method to a sample system and show that, depending on the kind of errors present within the system, a significantly reduced number of reference objects measurements will suffice for accurate characterization of the errors.

Original languageEnglish (US)
Title of host publicationPolarization
Subtitle of host publicationMeasurement, Analysis, and Remote Sensing XII
EditorsDavid B. Chenault, Dennis H. Goldstein
PublisherSPIE
ISBN (Electronic)9781510600942
DOIs
StatePublished - 2016
EventPolarization: Measurement, Analysis, and Remote Sensing XII - Baltimore, United States
Duration: Apr 18 2016Apr 19 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9853
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherPolarization: Measurement, Analysis, and Remote Sensing XII
CountryUnited States
CityBaltimore
Period4/18/164/19/16

Keywords

  • Calibration
  • Optimization
  • Partial Mueller Matrix
  • Polarimetry
  • Polarization

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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