Estimation of Fano factors in inorganic scintillators

Vaibhav Bora, Harrison Barrett, Kanai S. Shah, Jarek Glodo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

The correlation between outputs of two photodetectors on opposite faces of a scintillator crystal was used to deduce the Fano factor of the photoelectrons and the photons of scintillation light for different scintillators. The Fano factor of an integer-valued random process is defined as the ratio of its variance to its mean. A Poisson process has a Fano factor of one and a sub-Poisson process has a Fano factor of less than one. Correlation measurements were taken for a number of scintillators including YAP and SrI2, which have excellent energy resolution but very different light outputs. Measurements were also take for CsI:Na. From these measurements, the Fano factors for the photoelectrons as well as the optical photons were estimated.

Original languageEnglish (US)
Title of host publication2011 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages987-993
Number of pages7
ISBN (Print)9781467301183
DOIs
StatePublished - Jan 1 2011
Event2011 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011 - Valencia, Spain
Duration: Oct 23 2011Oct 29 2011

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Other

Other2011 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011
CountrySpain
CityValencia
Period10/23/1110/29/11

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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  • Cite this

    Bora, V., Barrett, H., Shah, K. S., & Glodo, J. (2011). Estimation of Fano factors in inorganic scintillators. In 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011 (pp. 987-993). [6154307] (IEEE Nuclear Science Symposium Conference Record). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2011.6154307