Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry

Jeremy A. Felton, Gregory D. Schilling, Steven J. Ray, Roger P. Sperline, M. Bonner Denton, Charles J. Barinaga, David W. Koppenaal, Gary M. Hieftje

Research output: Contribution to journalArticle

23 Scopus citations

Abstract

A fourth-generation focal plane camera containing 1696 Faraday-strip detectors was fitted to a Mattauch-Herzog mass spectrograph and characterized for its performance with inductively coupled plasma ionization. The camera provides limits of detection in the single to tens of ng L-1 range for most elements and has a linear dynamic range of at least nine orders of magnitude. Isotope-ratio precision better than 0.02% has also been achieved with this device, and this fourth-generation system features the broadest simultaneous mass range obtainable to date with this family of focal plane camera detectors.

Original languageEnglish (US)
Pages (from-to)300-304
Number of pages5
JournalJournal of Analytical Atomic Spectrometry
Volume26
Issue number2
DOIs
StatePublished - Feb 1 2011

ASJC Scopus subject areas

  • Analytical Chemistry
  • Spectroscopy

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    Felton, J. A., Schilling, G. D., Ray, S. J., Sperline, R. P., Denton, M. B., Barinaga, C. J., Koppenaal, D. W., & Hieftje, G. M. (2011). Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry. Journal of Analytical Atomic Spectrometry, 26(2), 300-304. https://doi.org/10.1039/c0ja00087f