Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry

Jeremy A. Felton, Gregory D. Schilling, Steven J. Ray, Roger P. Sperline, M Bonner Denton, Charles J. Barinaga, David W. Koppenaal, Gary M. Hieftje

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

A fourth-generation focal plane camera containing 1696 Faraday-strip detectors was fitted to a Mattauch-Herzog mass spectrograph and characterized for its performance with inductively coupled plasma ionization. The camera provides limits of detection in the single to tens of ng L-1 range for most elements and has a linear dynamic range of at least nine orders of magnitude. Isotope-ratio precision better than 0.02% has also been achieved with this device, and this fourth-generation system features the broadest simultaneous mass range obtainable to date with this family of focal plane camera detectors.

Original languageEnglish (US)
Pages (from-to)300-304
Number of pages5
JournalJournal of Analytical Atomic Spectrometry
Volume26
Issue number2
DOIs
StatePublished - Feb 2011

Fingerprint

Plasma sources
Mass spectrometry
Cameras
Detectors
Spectrographs
Inductively coupled plasma
Isotopes
Ionization

ASJC Scopus subject areas

  • Analytical Chemistry
  • Spectroscopy

Cite this

Felton, J. A., Schilling, G. D., Ray, S. J., Sperline, R. P., Denton, M. B., Barinaga, C. J., ... Hieftje, G. M. (2011). Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry. Journal of Analytical Atomic Spectrometry, 26(2), 300-304. https://doi.org/10.1039/c0ja00087f

Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry. / Felton, Jeremy A.; Schilling, Gregory D.; Ray, Steven J.; Sperline, Roger P.; Denton, M Bonner; Barinaga, Charles J.; Koppenaal, David W.; Hieftje, Gary M.

In: Journal of Analytical Atomic Spectrometry, Vol. 26, No. 2, 02.2011, p. 300-304.

Research output: Contribution to journalArticle

Felton, JA, Schilling, GD, Ray, SJ, Sperline, RP, Denton, MB, Barinaga, CJ, Koppenaal, DW & Hieftje, GM 2011, 'Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry', Journal of Analytical Atomic Spectrometry, vol. 26, no. 2, pp. 300-304. https://doi.org/10.1039/c0ja00087f
Felton, Jeremy A. ; Schilling, Gregory D. ; Ray, Steven J. ; Sperline, Roger P. ; Denton, M Bonner ; Barinaga, Charles J. ; Koppenaal, David W. ; Hieftje, Gary M. / Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry. In: Journal of Analytical Atomic Spectrometry. 2011 ; Vol. 26, No. 2. pp. 300-304.
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