Evaluation of Dilute Bismide Materials for Mid-IR Applications

Jorg Hader, S. C. Badescu, L. C. Bannow, Jerome V Moloney, S. R. Johnson, Stephan W Koch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The introduction of Bismide in InAs leads to a strong bandgap reduction on the order of 40-50meV per percent Bi-admixture. This allows InAsBi to be able to reach mid-IR wavelengths in the 3-5 μm range with less than about three percent Bi. Typically, materials for this wavelength range suffer from very strong Auger losses. These have so far limited room-temperature CW operation in devices based on type-I quantum wells to wavelength shorter than about 3.5 μm.

Original languageEnglish (US)
Title of host publication26th International Semiconductor Laser Conference, ISLC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages183-184
Number of pages2
Volume2018-September
ISBN (Electronic)9781538664865
DOIs
StatePublished - Oct 30 2018
Event26th International Semiconductor Laser Conference, ISLC 2018 - Santa Fe, United States
Duration: Sep 16 2018Sep 19 2018

Other

Other26th International Semiconductor Laser Conference, ISLC 2018
CountryUnited States
CitySanta Fe
Period9/16/189/19/18

Fingerprint

Wavelength
evaluation
wavelengths
admixtures
Semiconductor quantum wells
Energy gap
quantum wells
room temperature
Temperature

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Hader, J., Badescu, S. C., Bannow, L. C., Moloney, J. V., Johnson, S. R., & Koch, S. W. (2018). Evaluation of Dilute Bismide Materials for Mid-IR Applications. In 26th International Semiconductor Laser Conference, ISLC 2018 (Vol. 2018-September, pp. 183-184). [8516227] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISLC.2018.8516227

Evaluation of Dilute Bismide Materials for Mid-IR Applications. / Hader, Jorg; Badescu, S. C.; Bannow, L. C.; Moloney, Jerome V; Johnson, S. R.; Koch, Stephan W.

26th International Semiconductor Laser Conference, ISLC 2018. Vol. 2018-September Institute of Electrical and Electronics Engineers Inc., 2018. p. 183-184 8516227.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hader, J, Badescu, SC, Bannow, LC, Moloney, JV, Johnson, SR & Koch, SW 2018, Evaluation of Dilute Bismide Materials for Mid-IR Applications. in 26th International Semiconductor Laser Conference, ISLC 2018. vol. 2018-September, 8516227, Institute of Electrical and Electronics Engineers Inc., pp. 183-184, 26th International Semiconductor Laser Conference, ISLC 2018, Santa Fe, United States, 9/16/18. https://doi.org/10.1109/ISLC.2018.8516227
Hader J, Badescu SC, Bannow LC, Moloney JV, Johnson SR, Koch SW. Evaluation of Dilute Bismide Materials for Mid-IR Applications. In 26th International Semiconductor Laser Conference, ISLC 2018. Vol. 2018-September. Institute of Electrical and Electronics Engineers Inc. 2018. p. 183-184. 8516227 https://doi.org/10.1109/ISLC.2018.8516227
Hader, Jorg ; Badescu, S. C. ; Bannow, L. C. ; Moloney, Jerome V ; Johnson, S. R. ; Koch, Stephan W. / Evaluation of Dilute Bismide Materials for Mid-IR Applications. 26th International Semiconductor Laser Conference, ISLC 2018. Vol. 2018-September Institute of Electrical and Electronics Engineers Inc., 2018. pp. 183-184
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