Evaluation of mechanical properties of cells by scanning acoustic microscopy using V(z) characteristics

J. Bereiter-Hahn, F. Berghofer, Tribikram Kundu, C. Penzkofer, K. Hillmann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

Taking advantage of the deviation of the glass V(z) characteristics induced by a thin layer of cytoplasm on top of a plane glass surface we calculated the P-wave velocity, attenuation, thickness of the cytoplasmic layer, and density for a fixed endothelial cell in culture. For the first time the calculations were done for the full projection surface of a cell within the lateral resolution of the scanning acoustic microscope operated at 1 GHz (ca. 0.8 μm). Thus a 2-dimensional image of the stiffness distribution of a single cell was obtained at this resolution. The thickness values obtained were compared with the surface topography revealed by a light microscopic method (reflection interference microscopy) and gave good coincidence of the values. The coincidence of the thickness values achieved by two independent methods are in favor of the reliability of the parameters calculated from the acoustic images. High P-wave velocities appear in some F-actin accumulations.

Original languageEnglish (US)
Title of host publicationAmerican Society of Mechanical Engineers, Applied Mechanics Division, AMD
PublisherPubl by ASME
Pages71-80
Number of pages10
Volume140
ISBN (Print)0791810755
Publication statusPublished - 1992
Externally publishedYes
EventWinter Annual Meeting of the American Society of Mechanical Engineers - Anaheim, CA, USA
Duration: Nov 8 1992Nov 13 1992

Other

OtherWinter Annual Meeting of the American Society of Mechanical Engineers
CityAnaheim, CA, USA
Period11/8/9211/13/92

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ASJC Scopus subject areas

  • Mechanical Engineering

Cite this

Bereiter-Hahn, J., Berghofer, F., Kundu, T., Penzkofer, C., & Hillmann, K. (1992). Evaluation of mechanical properties of cells by scanning acoustic microscopy using V(z) characteristics. In American Society of Mechanical Engineers, Applied Mechanics Division, AMD (Vol. 140, pp. 71-80). Publ by ASME.