Event-driven framework for configurable runtime system observability for SOC designs

Jong Chul Lee, Faycel Kouteib, Roman Lysecky

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


The deep integration of software and hardware components within complex system-on-chip (SOC) designs prevents the use of traditional analysis and debug methods to observe the internal state of these components. This situation is further exacerbated for in-situ debugging, verification, and certification efforts in which physical access to traditional debug and trace interfaces is unavailable, infeasible, or cost prohibitive. In this paper, we present an overview of an event-driven system-level observation framework that provides low-overhead methods for observing and analyzing designer specified hardware and software events at runtime.

Original languageEnglish (US)
Title of host publicationITC 2012 - International Test Conference 2012, Proceedings
StatePublished - Dec 1 2012
Event2012 International Test Conference, ITC 2012 - Anaheim, CA, United States
Duration: Nov 6 2012Nov 8 2012

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539


Other2012 International Test Conference, ITC 2012
Country/TerritoryUnited States
CityAnaheim, CA

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Applied Mathematics


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