Experimental and computational investigation of microcrack behavior under combined environments in monocrystalline Si

W. J. Huang, S. Bringuier, J. Paul, Kelly Potter, Krishna Muralidharan, Barrett G Potter

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An investigation of microindenter-induced crack evolution with independent variation of both temperature and relative humidity has been pursued in PV-grade Si wafers. Under static tensile strain conditions, an increase in subcritical crack elongation with increasing atmospheric water content was observed. To provide further insight into the potential physical and chemical conditions at the microcrack tip, micro-Raman measurements were performed. Preliminary results confirm a spatial variation in the frequency of the primary Si vibrational resonance within the cracktip region, associated with local stress state, whose magnitude is influenced by environmental conditions during the period of applied static strain. The experimental effort was paired with molecular dynamics (MD) investigations of microcrack evolution in single-crystal Si to furnish additional insight into mechanical contributions to crack elongation. The MD results demonstrate that crack-tip energetics and associated crack elongation velocity and morphology are intimately related to the crack and applied strain orientations with respect to the principal crystallographic axes. The resulting elastic strain energy release rate and the stress-strain response of the Si under these conditions form the basis for preliminary micro-scale peridynamics (PD) simulations of microcrack development under constant applied strain. These efforts will be integrated with the experimental results to further inform the mechanisms contributing to this important degradation mode in Si-based photovoltaics.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9563
ISBN (Print)9781628417296
DOIs
StatePublished - 2015
Event8th Reliability of Photovoltaic Cells, Modules, Components and Systems Conference - San Diego, United States
Duration: Aug 9 2015Aug 10 2015

Other

Other8th Reliability of Photovoltaic Cells, Modules, Components and Systems Conference
CountryUnited States
CitySan Diego
Period8/9/158/10/15

Fingerprint

Microcracks
microcracks
Crack
cracks
Cracks
Elongation
elongation
Molecular Dynamics
Molecular dynamics
strain energy release rate
molecular dynamics
Energy Release Rate
Relative Humidity
Water Content
Tensile strain
Energy release rate
crack tips
Strain Energy
Crack Tip
Raman

Keywords

  • Microcrack propagation
  • molecular dynamics
  • monocrystalline Si
  • peridynamics
  • photovoltaic

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Huang, W. J., Bringuier, S., Paul, J., Potter, K., Muralidharan, K., & Potter, B. G. (2015). Experimental and computational investigation of microcrack behavior under combined environments in monocrystalline Si. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 9563). [956308] SPIE. https://doi.org/10.1117/12.2188521

Experimental and computational investigation of microcrack behavior under combined environments in monocrystalline Si. / Huang, W. J.; Bringuier, S.; Paul, J.; Potter, Kelly; Muralidharan, Krishna; Potter, Barrett G.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9563 SPIE, 2015. 956308.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Huang, WJ, Bringuier, S, Paul, J, Potter, K, Muralidharan, K & Potter, BG 2015, Experimental and computational investigation of microcrack behavior under combined environments in monocrystalline Si. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 9563, 956308, SPIE, 8th Reliability of Photovoltaic Cells, Modules, Components and Systems Conference, San Diego, United States, 8/9/15. https://doi.org/10.1117/12.2188521
Huang WJ, Bringuier S, Paul J, Potter K, Muralidharan K, Potter BG. Experimental and computational investigation of microcrack behavior under combined environments in monocrystalline Si. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9563. SPIE. 2015. 956308 https://doi.org/10.1117/12.2188521
Huang, W. J. ; Bringuier, S. ; Paul, J. ; Potter, Kelly ; Muralidharan, Krishna ; Potter, Barrett G. / Experimental and computational investigation of microcrack behavior under combined environments in monocrystalline Si. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9563 SPIE, 2015.
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