Extended depth-of-field microscopic imaging with a variable focus microscope objective

Sheng Liu, Hong Hua

Research output: Contribution to journalArticle

60 Citations (Scopus)

Abstract

Increasing the depth-of-field (DOF) while maintaining high resolution imaging has been a classical challenge for conventional microscopes. Extended DOF (EDOF) is especially essential for imaging thick specimens. We present a microscope capable of capturing EDOF images in a single shot. A volumetric optical sampling method is applied by rapidly scanning the focus of a vari-focal microscope objective throughout the extended depths of a thick specimen within the duration of a single detector exposure. An EDOF image is reconstructed by deconvolving the captured image with the response function of the system. Design of a varifocal objective and algorithms for restoring EDOF images are presented. Proof-of-concept experimental results demonstrate significantly extended DOF compared to the conventional microscope counterparts.

Original languageEnglish (US)
Pages (from-to)353-362
Number of pages10
JournalOptics Express
Volume19
Issue number1
DOIs
StatePublished - Jan 3 2011

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Extended depth-of-field microscopic imaging with a variable focus microscope objective. / Liu, Sheng; Hua, Hong.

In: Optics Express, Vol. 19, No. 1, 03.01.2011, p. 353-362.

Research output: Contribution to journalArticle

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