Abstract
The small-signal modulation response of a vertical external cavity surface emitting laser is analyzed to determine its resonance frequency in relation to photon density, allowing nondestructive extraction of characteristic parameters of chips, such as internal loss and differential gain.
Original language | English (US) |
---|---|
Article number | 111101 |
Journal | Applied Physics Letters |
Volume | 95 |
Issue number | 11 |
DOIs | |
State | Published - Oct 5 2009 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)