FABRICATION AND PROPERTIES OF HIGH-TEMPERATURE WEAK LINKS AND SQUID'S.

C. T. Wu, Charles M Falco

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Results are presented on the fabrication and properties of high-T//c Nb//3Sn thin-film weak links and SQUID's prepared by radiation damage of localized regions. High-temperature thin-film weak links with current-voltage characteristics similar to those produced either by proximity effect or ion-implantation techniques have been successfully fabricated using radiation damage. High-temperature (operation temperature greater than 14. 5 K) Nb//3Sn thin-film SQUID's with sensing area approximately 3 mm**2 have been successfully fabricated using these weak links.

Original languageEnglish (US)
Pages (from-to)361-365
Number of pages5
JournalJournal of Applied Physics
Volume49
Issue number1
DOIs
StatePublished - Jan 1978
Externally publishedYes

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radiation damage
fabrication
thin films
ion implantation
electric potential
temperature

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physics and Astronomy (miscellaneous)

Cite this

FABRICATION AND PROPERTIES OF HIGH-TEMPERATURE WEAK LINKS AND SQUID'S. / Wu, C. T.; Falco, Charles M.

In: Journal of Applied Physics, Vol. 49, No. 1, 01.1978, p. 361-365.

Research output: Contribution to journalArticle

@article{b5dbb78ed9aa42bfb65239f678500919,
title = "FABRICATION AND PROPERTIES OF HIGH-TEMPERATURE WEAK LINKS AND SQUID'S.",
abstract = "Results are presented on the fabrication and properties of high-T//c Nb//3Sn thin-film weak links and SQUID's prepared by radiation damage of localized regions. High-temperature thin-film weak links with current-voltage characteristics similar to those produced either by proximity effect or ion-implantation techniques have been successfully fabricated using radiation damage. High-temperature (operation temperature greater than 14. 5 K) Nb//3Sn thin-film SQUID's with sensing area approximately 3 mm**2 have been successfully fabricated using these weak links.",
author = "Wu, {C. T.} and Falco, {Charles M}",
year = "1978",
month = "1",
doi = "10.1063/1.324397",
language = "English (US)",
volume = "49",
pages = "361--365",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "1",

}

TY - JOUR

T1 - FABRICATION AND PROPERTIES OF HIGH-TEMPERATURE WEAK LINKS AND SQUID'S.

AU - Wu, C. T.

AU - Falco, Charles M

PY - 1978/1

Y1 - 1978/1

N2 - Results are presented on the fabrication and properties of high-T//c Nb//3Sn thin-film weak links and SQUID's prepared by radiation damage of localized regions. High-temperature thin-film weak links with current-voltage characteristics similar to those produced either by proximity effect or ion-implantation techniques have been successfully fabricated using radiation damage. High-temperature (operation temperature greater than 14. 5 K) Nb//3Sn thin-film SQUID's with sensing area approximately 3 mm**2 have been successfully fabricated using these weak links.

AB - Results are presented on the fabrication and properties of high-T//c Nb//3Sn thin-film weak links and SQUID's prepared by radiation damage of localized regions. High-temperature thin-film weak links with current-voltage characteristics similar to those produced either by proximity effect or ion-implantation techniques have been successfully fabricated using radiation damage. High-temperature (operation temperature greater than 14. 5 K) Nb//3Sn thin-film SQUID's with sensing area approximately 3 mm**2 have been successfully fabricated using these weak links.

UR - http://www.scopus.com/inward/record.url?scp=0017905744&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0017905744&partnerID=8YFLogxK

U2 - 10.1063/1.324397

DO - 10.1063/1.324397

M3 - Article

AN - SCOPUS:0017905744

VL - 49

SP - 361

EP - 365

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 1

ER -