Failure time based reliability growth in product development and manufacturing

Jin Tongdan, Haitao Liao, Luo Wen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

The Failure-In-Time (FIT) rate is widely used to quantify the reliability of a electronic component. It fails to indicate the portion of the failures due to either environmental or electrical stresses or issues that are related to process/handing, manufacturing and applications. To meet this end, FIT-based corrective action driven metrics are proposed to link the failure mode (FM) with components and non-component faults. First the conventional failure mode pareto is reviewed and its deficiency is discussed. Then a new index called the failure mode rate (FMR) is introduced to monitor the FM trend and evaluate the effectiveness of corrective actions (C/As). Based on the FMR, the FIT rate is extended to non-component failure mode and further to individual failure mode in predicting the reliability of electronic products. The extended FIT rate enables product designers to narrow down the root-cause of the failure, identify the C/A ownership, and estimate the MTBF improvement. The new metrics provide a guideline for prioritizing resources to attack the critical failures with the minimum cost.

Original languageEnglish (US)
Title of host publication2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS
Pages488-493
Number of pages6
DOIs
Publication statusPublished - 2007
Externally publishedYes
Event2007 53rd Annual Reliability and Maintainability Sympsoium, RAMS - Orlando, FL, United States
Duration: Jan 22 2006Jan 25 2006

Other

Other2007 53rd Annual Reliability and Maintainability Sympsoium, RAMS
CountryUnited States
CityOrlando, FL
Period1/22/061/25/06

    Fingerprint

Keywords

  • Corrective action
  • Failure-in-time
  • Mean time between failures
  • Pareto chart

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Tongdan, J., Liao, H., & Wen, L. (2007). Failure time based reliability growth in product development and manufacturing. In 2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS (pp. 488-493). [4126400] https://doi.org/10.1109/RAMS.2007.328084