Fast and accurate thickness determination of unknown materials using terahertz time domain spectroscopy

Maik Scheller, Martin Koch

Research output: Contribution to journalArticlepeer-review

34 Scopus citations

Abstract

We present a fast and accurate time domain based algorithm which extracts simultaneously the thickness and refractive index of highly transparent samples from terahertz time domain spectroscopy data. The utilized transfer function considers the Fabry-Perot oscillations of the sample and enables to analyze data with multiple reflections. The algorithm can also be applied to signals corrupted by vapor absorption lines. Since the data extraction takes only fractions of a second, this computation method is well suited for real-time monitoring of industrial processes. We show that the accuracy of the new algorithm is comparable to that of sophisticated, highly accurate and time consumptive frequency domain algorithms.

Original languageEnglish (US)
Pages (from-to)762-769
Number of pages8
JournalJournal of Infrared, Millimeter, and Terahertz Waves
Volume30
Issue number7
DOIs
StatePublished - Jul 1 2009

Keywords

  • Data analysis
  • Fabry-Perot
  • Real time
  • Terahertz
  • Thickness determination
  • Time domain

ASJC Scopus subject areas

  • Radiation
  • Instrumentation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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