Fast-scan controlled-adsorption voltammetry for the quantification of absolute concentrations and adsorption dynamics

Christopher W. Atcherley, Nicholas D. Laude, Kate L. Parent, Michael L Heien

Research output: Contribution to journalArticle

45 Citations (Scopus)

Abstract

Fast-scan cyclic voltammetry has depended on background subtraction to quantify small changes in neurotransmitter concentration. Because of this requirement, measurements of absolute concentrations using fast-scan cyclic voltammetry have been limited. Here we develop and characterize fast-scan controlled-adsorption voltammetry (FSCAV), which enables direct measurements of absolute concentrations in vitro without the use of flow injection to change the concentration. This enables probing the diffusion-controlled adsorption dynamics of biogenic amines and other adsorbing species. An implicit finite-difference model of mass-transport-limited adsorption was developed and is in agreement with experimental results. Optimization of FSCAV yielded a sensitivity of 81 ± 11 nA/μM for dopamine, corresponding to a limit of detection of 3.7 ± 0.5 nM. Through the combination of novel instrumentation and validated computer simulations, we show that FSCAV is an important measurement tool that can be used to determine absolute concentrations and study mass-transport-limited adsorption.

Original languageEnglish (US)
Pages (from-to)14885-14892
Number of pages8
JournalLangmuir
Volume29
Issue number48
DOIs
StatePublished - Dec 3 2013

Fingerprint

Voltammetry
Adsorption
adsorption
Cyclic voltammetry
Mass transfer
neurotransmitters
dopamine
Biogenic Amines
subtraction
Neurotransmitter Agents
Amines
Dopamine
amines
computerized simulation
injection
requirements
optimization
sensitivity
Computer simulation

ASJC Scopus subject areas

  • Electrochemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Materials Science(all)
  • Spectroscopy

Cite this

Fast-scan controlled-adsorption voltammetry for the quantification of absolute concentrations and adsorption dynamics. / Atcherley, Christopher W.; Laude, Nicholas D.; Parent, Kate L.; Heien, Michael L.

In: Langmuir, Vol. 29, No. 48, 03.12.2013, p. 14885-14892.

Research output: Contribution to journalArticle

Atcherley, Christopher W. ; Laude, Nicholas D. ; Parent, Kate L. ; Heien, Michael L. / Fast-scan controlled-adsorption voltammetry for the quantification of absolute concentrations and adsorption dynamics. In: Langmuir. 2013 ; Vol. 29, No. 48. pp. 14885-14892.
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