Feature analysis using millimeter-wave real beam and Doppler beam sharpening techniques

M. L. Cassabaum, J. J. Rodríguez, J. G. Riddle, D. E. Waagen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

A challenging problem in digital signal and image processing is that of automatic target recognition (ATR) and object classification. In defense operations in particular, rapid object discrimination is critical. While this problem has been studied extensively, it remains a challenge, due to the complex and time-intensive methods of typical approaches. This study involved constructing features from the range profile signal returns, identifying the "best" set of features and performing ATR. Confusion matrices are presented for the targets of interest for simulation. Although the selection techniques for the features were not optimized, the results for ATR are promising.

Original languageEnglish (US)
Title of host publicationProceedings - 5th IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2002
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages101-105
Number of pages5
ISBN (Electronic)0769515371
DOIs
StatePublished - Jan 1 2002
Event5th IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2002 - Santa Fe, United States
Duration: Apr 7 2002Apr 9 2002

Publication series

NameProceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation
Volume2002-January

Other

Other5th IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2002
CountryUnited States
CitySanta Fe
Period4/7/024/9/02

Keywords

  • Clutter
  • Layout
  • Millimeter wave radar
  • Millimeter wave technology
  • Radar cross section
  • Radar detection
  • Satellite broadcasting
  • Signal processing
  • Statistics
  • Thyristors

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition
  • Computer Science Applications

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  • Cite this

    Cassabaum, M. L., Rodríguez, J. J., Riddle, J. G., & Waagen, D. E. (2002). Feature analysis using millimeter-wave real beam and Doppler beam sharpening techniques. In Proceedings - 5th IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2002 (pp. 101-105). [999898] (Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation; Vol. 2002-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IAI.2002.999898