Finite Alphabet Iterative Decoders - Part II: Towards Guaranteed Error Correction of LDPC Codes via Iterative Decoder Diversity

David Declercq, Bane Vasic, Shiva Kumar Planjery, Erbao Li

Research output: Contribution to journalArticle

17 Scopus citations

Abstract

Recently, we introduced a new class of finite alphabet iterative decoders (FAIDs) for low-density parity-check (LDPC) codes. These decoders are capable of surpassing belief propagation (BP) in the error floor region on the binary symmetric channel (BSC) with much lower complexity. In this paper, we introduce a novel scheme with the objective of guaranteeing the correction of a given and potentially large number of errors on column-weight-three LDPC codes. The proposed scheme uses a plurality of FAIDs which collectively correct more error patterns than a single FAID on a given code. The collection of FAIDs utilized by the scheme is judiciously chosen to ensure that individual decoders have different decoding dynamics and correct different error patterns. Consequently, they can collectively correct a diverse set of error patterns, which is referred to as decoder diversity. We provide a systematic method to generate the set of FAIDs for decoder diversity on a given code based on the knowledge of the most harmful trapping sets present in the code. Using the well-known column-weight-three (155,64) Tanner code with d{min} = 20 as an example, we describe the method in detail and show, by means of exhaustive simulation, that the guaranteed error correction capability on short length LDPC codes can be significantly increased with decoder diversity.

Original languageEnglish (US)
Article number6600720
Pages (from-to)4046-4057
Number of pages12
JournalIEEE Transactions on Communications
Volume61
Issue number10
DOIs
StatePublished - Oct 1 2013

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Keywords

  • Low-density parity-check codes
  • Tanner QC-LDPC code
  • decoder diversity
  • error floor
  • finite alphabet iterative decoder
  • guaranteed error correction
  • trapping sets

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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