Fourier fluorescence spectrometer for excitation emission matrix measurement

Leilei Peng, Joseph A. Gardecki, Brett E. Bouma, Guillermo J. Tearney

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We demonstrate a fluorescence spectrometer that utilizes principles of Fourier transform spectroscopy to measure excitation emission matrices (EEM) rapidly and with high spectral resolution. For this EEM fluorometer, incoherent excitation light is first input into a differential-delay scanning Michelson interferometer. Light from the output port excites sample fluorescence. The fluorescence remitted from the sample is directed to a second Michelson interferometer, whose differential-delay scanning is synchronized with the first interferometer. The EEM is obtained by twodimensional Fourier analysis of the detected signal from the output port of the second interferometer. EEM results from the system are verified by comparing with results from a standard spectrometer. The system provides a wide spectral range, adjustable spectral resolution, and fast EEM acquisition speed, which allows EEM's to be acquired in 40 seconds at a spectral resolution of 81-cm-1.

Original languageEnglish (US)
Pages (from-to)10493-10500
Number of pages8
JournalOptics Express
Volume16
Issue number14
DOIs
StatePublished - Jul 7 2008
Externally publishedYes

Fingerprint

spectrometers
fluorescence
matrices
spectral resolution
excitation
Michelson interferometers
interferometers
scanning
output
Fourier analysis
acquisition
high resolution
spectroscopy

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Fourier fluorescence spectrometer for excitation emission matrix measurement. / Peng, Leilei; Gardecki, Joseph A.; Bouma, Brett E.; Tearney, Guillermo J.

In: Optics Express, Vol. 16, No. 14, 07.07.2008, p. 10493-10500.

Research output: Contribution to journalArticle

Peng, Leilei ; Gardecki, Joseph A. ; Bouma, Brett E. ; Tearney, Guillermo J. / Fourier fluorescence spectrometer for excitation emission matrix measurement. In: Optics Express. 2008 ; Vol. 16, No. 14. pp. 10493-10500.
@article{c88bfeb330c2414b8da34c3b9dba2039,
title = "Fourier fluorescence spectrometer for excitation emission matrix measurement",
abstract = "We demonstrate a fluorescence spectrometer that utilizes principles of Fourier transform spectroscopy to measure excitation emission matrices (EEM) rapidly and with high spectral resolution. For this EEM fluorometer, incoherent excitation light is first input into a differential-delay scanning Michelson interferometer. Light from the output port excites sample fluorescence. The fluorescence remitted from the sample is directed to a second Michelson interferometer, whose differential-delay scanning is synchronized with the first interferometer. The EEM is obtained by twodimensional Fourier analysis of the detected signal from the output port of the second interferometer. EEM results from the system are verified by comparing with results from a standard spectrometer. The system provides a wide spectral range, adjustable spectral resolution, and fast EEM acquisition speed, which allows EEM's to be acquired in 40 seconds at a spectral resolution of 81-cm-1.",
author = "Leilei Peng and Gardecki, {Joseph A.} and Bouma, {Brett E.} and Tearney, {Guillermo J.}",
year = "2008",
month = "7",
day = "7",
doi = "10.1364/OE.16.010493",
language = "English (US)",
volume = "16",
pages = "10493--10500",
journal = "Optics Express",
issn = "1094-4087",
publisher = "The Optical Society",
number = "14",

}

TY - JOUR

T1 - Fourier fluorescence spectrometer for excitation emission matrix measurement

AU - Peng, Leilei

AU - Gardecki, Joseph A.

AU - Bouma, Brett E.

AU - Tearney, Guillermo J.

PY - 2008/7/7

Y1 - 2008/7/7

N2 - We demonstrate a fluorescence spectrometer that utilizes principles of Fourier transform spectroscopy to measure excitation emission matrices (EEM) rapidly and with high spectral resolution. For this EEM fluorometer, incoherent excitation light is first input into a differential-delay scanning Michelson interferometer. Light from the output port excites sample fluorescence. The fluorescence remitted from the sample is directed to a second Michelson interferometer, whose differential-delay scanning is synchronized with the first interferometer. The EEM is obtained by twodimensional Fourier analysis of the detected signal from the output port of the second interferometer. EEM results from the system are verified by comparing with results from a standard spectrometer. The system provides a wide spectral range, adjustable spectral resolution, and fast EEM acquisition speed, which allows EEM's to be acquired in 40 seconds at a spectral resolution of 81-cm-1.

AB - We demonstrate a fluorescence spectrometer that utilizes principles of Fourier transform spectroscopy to measure excitation emission matrices (EEM) rapidly and with high spectral resolution. For this EEM fluorometer, incoherent excitation light is first input into a differential-delay scanning Michelson interferometer. Light from the output port excites sample fluorescence. The fluorescence remitted from the sample is directed to a second Michelson interferometer, whose differential-delay scanning is synchronized with the first interferometer. The EEM is obtained by twodimensional Fourier analysis of the detected signal from the output port of the second interferometer. EEM results from the system are verified by comparing with results from a standard spectrometer. The system provides a wide spectral range, adjustable spectral resolution, and fast EEM acquisition speed, which allows EEM's to be acquired in 40 seconds at a spectral resolution of 81-cm-1.

UR - http://www.scopus.com/inward/record.url?scp=47249125785&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=47249125785&partnerID=8YFLogxK

U2 - 10.1364/OE.16.010493

DO - 10.1364/OE.16.010493

M3 - Article

C2 - 18607462

AN - SCOPUS:47249125785

VL - 16

SP - 10493

EP - 10500

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 14

ER -